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公开(公告)号:US20230236507A1
公开(公告)日:2023-07-27
申请号:US17585033
申请日:2022-01-26
发明人: Tzu-Yang LIN , Chen-Yu LIU , Ching-Yu CHANG
CPC分类号: G03F7/0392 , G03F7/0045 , G03F7/2006 , C25D7/12 , G03F7/322 , G03F7/34
摘要: A method of manufacturing a semiconductor structure includes the following operations. A photoresist layer is formed on a metal layer, in which the photoresist layer includes an additive selected from the group consisting of a first heterocyclic compound containing a triazole ring, a second heterocyclic compound containing an imidazole ring, biphenyl thiol, biphenyl dithiol, benzenethiol, and benzenedithiol. The photoresist layer is exposed to an actinic radiation. The photoresist layer is developed by a developer to form holes in the photoresist layer. Redistribution lines are formed in the holes by an electroplating process.
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公开(公告)号:US20230375920A1
公开(公告)日:2023-11-23
申请号:US18230062
申请日:2023-08-03
发明人: Ming-Hui WENG , Chen-Yu LIU , Chih-Cheng LIU , Yi-Chen KUO , Jia-Lin WEI , Yen-Yu CHEN , Jr-Hung LI , Yahru CHENG , Chi-Ming YANG , Tze-Liang LEE , Ching-Yu CHANG
IPC分类号: G03F7/004 , H01L21/033 , G03F7/00
CPC分类号: G03F7/004 , H01L21/0332 , G03F7/0035
摘要: A method of manufacturing a semiconductor device includes forming a photoresist layer over a substrate, including combining a first precursor and a second precursor in a vapor state to form a photoresist material, and depositing the photoresist material over the substrate. A protective layer is formed over the photoresist layer. The photoresist layer is selectively exposed to actinic radiation through the protective layer to form a latent pattern in the photoresist layer. The protective layer is removed, and the latent pattern is developed by applying a developer to the selectively exposed photoresist layer to form a pattern.
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公开(公告)号:US20230282477A1
公开(公告)日:2023-09-07
申请号:US18197640
申请日:2023-05-15
发明人: Ming-Hui WENG , An-Ren Zl , Ching-Yu CHANG , Chen-Yu LIU
IPC分类号: H01L21/027 , G03F7/11 , G03F7/00
CPC分类号: H01L21/0271 , G03F7/11 , G03F7/0025
摘要: A method of forming a pattern in a photoresist includes forming a photoresist layer over a substrate, and selectively exposing the photoresist layer to actinic radiation to form a latent pattern. The latent pattern is developed by applying a developer composition to the selectively exposed photoresist layer to form a pattern. The developer composition includes a first solvent having Hansen solubility parameters of 15 pKa>9.5; and a second solvent having a dielectric constant greater than 18. The first solvent and the second solvent are different solvents.
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公开(公告)号:US20210364924A1
公开(公告)日:2021-11-25
申请号:US17246427
申请日:2021-04-30
发明人: Chen-Yu LIU , Ming-Hui WENG , An-Ren ZI , Ching-Yu CHANG , Chin-Hsiang LIN
IPC分类号: G03F7/32 , H01L21/027 , H01L21/308
摘要: A method of manufacturing a semiconductor device includes forming a photoresist layer over a substrate and selectively exposing the photoresist layer to actinic radiation to form a latent pattern. The latent pattern is developed by applying a developer composition to the selectively exposed photoresist layer to form a pattern in the photoresist layer. The developer composition includes: a first solvent having Hansen solubility parameters of 18>δd>3, 7>δp>1, and 7>δh>1; an organic acid having an acid dissociation constant, pKa, of −11
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公开(公告)号:US20230367218A1
公开(公告)日:2023-11-16
申请号:US18223936
申请日:2023-07-19
发明人: Ya-Ching CHANG , Chen-Yu LIU , Ching-Yu CHANG , Chin-Hsiang LIN
CPC分类号: G03F7/16 , H01L21/67017 , H01L21/6715 , B05D1/005
摘要: In a method, a resist material is dispensed through a tube of a nozzle of a resist pump system on a wafer. The tube extends from a top to a bottom of the nozzle and has upper, lower, and middle segments. When not dispensing, the resist material is retracted from the lower and the middle segments, and maintained in the upper segment of the tube. When retracting, a first solvent is flown through a tip of the nozzle at the bottom of the nozzle to fill the lower segment of the tube with the first solvent and to produce a gap in the middle segment of the tube between the resist material and the first solvent. The middle segment includes resist material residues on an inner surface wall of the tube and vapor of the first solvent. The vapor of the first solvent prevents the resist material residues from drying.
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公开(公告)号:US20230050816A1
公开(公告)日:2023-02-16
申请号:US17401244
申请日:2021-08-12
发明人: Tzu-Yang LIN , Yu-Cheng CHANG , Cheng-Han WU , Shang-Sheng LI , Chen-Yu LIU , Chen Yi HSU
摘要: A dispensing system includes a dispense material supply that contains a dispense material and a dispensing pump connected downstream from the dispense material supply. The dispensing pump includes a body made of a first electrically conductive material, one or more first electrical contacts that are disposed on the body of the dispensing pump, and one or more first connection wires that are coupled between each one of the one or more first electrical contacts and ground. The dispensing system also includes a dispensing nozzle connected downstream from the dispensing pump and includes a tube made of a second electrically conductive material, one or more second electrical contacts that are disposed on an outer surface of the tube, and one or more second connection wires that are coupled between each one of the one or more second electrical contacts and the ground.
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公开(公告)号:US20220291586A1
公开(公告)日:2022-09-15
申请号:US17486223
申请日:2021-09-27
发明人: Ming-Hui WENG , Chen-Yu LIU , Ching-Yu CHANG
摘要: A method for manufacturing a semiconductor device includes forming a resist underlayer over a substrate. The resist underlayer includes an underlayer composition, including: a polymer with pendant photoacid generator (PAG) groups, pendant thermal acid generator (TAG) groups, a combination of pendant PAG and pendant TAG groups, pendant photobase generator (PBG) groups, pendant thermal base generator (TBG) groups, or a combination of pendant PBG and pendant TBG groups. A photoresist layer including a photoresist composition is formed over the resist underlayer. The photoresist layer is selectively exposed to actinic radiation. The selectively exposed photoresist layer is developed to form a pattern in the photoresist layer.
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公开(公告)号:US20210286269A1
公开(公告)日:2021-09-16
申请号:US17320754
申请日:2021-05-14
发明人: Ming-Hui WENG , An-Ren ZI , Ching-Yu CHANG , Chin-Hsiang LIN , Chen-Yu LIU
IPC分类号: G03F7/30 , H01L21/033 , H01L21/311 , H01L21/02 , H01L21/3115 , G03F7/32 , G03F7/40
摘要: A method for forming a semiconductor device structure is provided. The method includes forming a resist layer over a material layer, the resist layer includes an inorganic material. The inorganic material includes a plurality of metallic cores and a plurality of first linkers bonded to the metallic cores. The method includes forming a modified layer over the resist layer, and the modified layer includes an auxiliary. The method includes performing an exposure process on the modified layer and the resist layer, and removing a portion of the modified layer and a first portion of the resist layer by a first developer. The first developer includes a ketone-based solvent having a substituted or unsubstituted C6-C7 cyclic ketone, an ester-based solvent having a formula (b), or a combination thereof.
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公开(公告)号:US20230384675A1
公开(公告)日:2023-11-30
申请号:US18232774
申请日:2023-08-10
发明人: Ming-Hui WENG , Chen-Yu LIU , Ching-Yu CHANG
CPC分类号: G03F7/0392 , G03F7/0045 , G03F7/38 , G03F7/325 , G03F7/2004 , G03F7/0755 , G03F7/40
摘要: A polymer composition comprises a polymer having a main chain and pendant photobase generator (PBG) groups, pendant thermal base generator (TBG) groups, or a combination of pendant PBG and pendant TBG groups.
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