Dual-interferometer method for measuring bending of materials
    1.
    发明授权
    Dual-interferometer method for measuring bending of materials 有权
    用于测量材料弯曲的双干涉仪方法

    公开(公告)号:US06495819B1

    公开(公告)日:2002-12-17

    申请号:US09634553

    申请日:2000-08-08

    IPC分类号: G01J400

    CPC分类号: G01B11/161

    摘要: A method of two interferometric configurations to measure bending of an extended element. The measurement arm of each configuration is a long optical fiber. A first interferometric configuration has a segment of its measurement arm attached to one side of the element. The second interferometric configuration has a segment of its measurement arm attached to one side of the element and another segment of its measurement arm attached to an opposing side of the element. The two configurations are used to obtain two sets of interference fringe measurement values. If one set is subtracted from the other, the result is intensity differential values that indicate only the effects of bending and not of temperature or pressure. Variations of the method can be used for irregularly shaped elements.

    摘要翻译: 一种用于测量延伸元件的弯曲的两种干涉测量配置的方法。 每个配置的测量臂是长光纤。 第一干涉配置具有连接到元件一侧的其测量臂的一段。 第二干涉结构具有附接到元件的一侧的其测量臂的一部分,并且其测量臂的另一段附接到元件的相对侧。 这两种配置用于获得两组干涉条纹测量值。 如果从另一组中减去一组,则结果是仅指示弯曲效果而不是温度或压力的强度差异值。 该方法的变化可用于不规则形状的元件。

    System and method for sensitive photon detection
    2.
    发明授权
    System and method for sensitive photon detection 有权
    敏感光子检测系统和方法

    公开(公告)号:US07372031B2

    公开(公告)日:2008-05-13

    申请号:US11384574

    申请日:2006-03-20

    IPC分类号: G01J1/00

    摘要: A sensitive photon detection system generates an electronic photon sensor signal as a K factor times a number N photons per unit time. The system is configured by combining a separate optical amplifier with a gain factor K1 with a photo detector with a gain factor K2 such that K may be realized as the product of K1 and K2. The values of K1 and K2 are chosen to meet a predetermined K while optimizing a signal quality of the photon sensor signal. The optical amplifier may be preceded by a photon gathering device and/or a light chopping device to further optimize system performance. Further, the photon sensor signal may be further processed analog circuitry or may be digitized and processed using digital signal processing to generate an enhanced photon sensor signal with enhanced signal quality by adding gain and/or bandwidth limiting.

    摘要翻译: 敏感光子检测系统产生电子光子传感器信号作为每单位时间数N个光子的K因子。 该系统通过将具有增益因子K 1的单独光学放大器与增益因子K 2的光电检测器组合,使得可以实现K作为K 1和K 2的乘积来配置该系统。 选择K 1和K 2的值以在优化光子传感器信号的信号质量的同时满足预定的K。 光放大器之前可以有光子收集装置和/或光斩波装置,以进一步优化系统性能。 此外,光子传感器信号可以进一步处理模拟电路,或者可以使用数字信号处理进行数字化和处理,以通过增加增益和/或带宽限制来产生增强的信号质量的增强的光子传感器信号。

    RF FIELD SHAPING AND ATTENUATION FOR EMAI INDUCTION ELEMENTS
    3.
    发明申请
    RF FIELD SHAPING AND ATTENUATION FOR EMAI INDUCTION ELEMENTS 审中-公开
    EMAI感应元件的射频场形成和衰减

    公开(公告)号:US20110166438A1

    公开(公告)日:2011-07-07

    申请号:US12896733

    申请日:2010-10-01

    IPC分类号: A61B8/13 A61B8/00 A61B5/055

    CPC分类号: A61B5/0051 G01R33/4814

    摘要: An Electro-Magnetic Imaging (EMAI) System is presented. EMAI systems can include induction elements (e.g., an induction coil) configured to induce a target tissue to generate internally sourced ultrasounds. The induction elements can be shielded by one or more shielding elements to shape, or otherwise alter, an imaging field while attenuating radiated fields in a far zone. EMAI systems can further include a shield tuner to adjust shield parameters to achieved desired imaging or radiated field properties. A shielding element can be placed approximately one induction coil radius away from the coil to achieve suitably strong imaging field magnitudes while also achieving suitably weak radiated field magnitudes in a far zone. In some embodiments, acoustic sensors lack substantial shielding from the fields generated by the induction elements.

    摘要翻译: 介绍了电磁成像(EMAI)系统。 EMAI系统可以包括被配置为诱导靶组织以产生内部来源的超声波的感应元件(例如感应线圈)。 感应元件可以被一个或多个屏蔽元件屏蔽,以形成或以其它方式改变成像场,同时衰减远区中的辐射场。 EMAI系统还可以包括屏蔽调谐器来调节屏蔽参数以实现期望的成像或辐射场特性。 屏蔽元件可以放置在大约一个感应线圈半径远离线圈,以实现适当强的成像磁场强度,同时在远区域也实现适当的弱辐射场强。 在一些实施例中,声传感器缺少与感应元件产生的场的实质屏蔽。

    Optimization of curved waveguide design to reduce transmission losses
    4.
    发明授权
    Optimization of curved waveguide design to reduce transmission losses 有权
    弯曲波导设计优化,减少传输损耗

    公开(公告)号:US06463202B1

    公开(公告)日:2002-10-08

    申请号:US09591084

    申请日:2000-06-09

    IPC分类号: G02B610

    摘要: A waveguide designed to minimize bend-induced losses. The waveguide has three regions of varying indices of refraction. The indices of refraction are chosen so that the field is a trigonometric function in the core region, evanescent in the intermediate region, and trigonometric again in the outer region. The widths of each region are calculated to further reduce losses.

    摘要翻译: 设计用于最小化弯曲损耗的波导。 波导具有不同折射率的三个区域。 选择折射率使得该场是核心区域中的三角函数,在中间区域中消逝,并且再次在外部区域中进行三角函数。 计算每个区域的宽度以进一步减少损失。

    Pressure and temperature sensor transducer array
    7.
    发明授权
    Pressure and temperature sensor transducer array 失效
    压力和温度传感器传感器阵列

    公开(公告)号:US5984874A

    公开(公告)日:1999-11-16

    申请号:US911216

    申请日:1997-08-14

    申请人: Stephen A. Cerwin

    发明人: Stephen A. Cerwin

    CPC分类号: A61B5/021 G01K1/045 A61B5/01

    摘要: A pressure or temperature sensor array utilizing a combination of liquid crystal material and charge coupled device (CCD) sensor array. The device generally comprises a liquid crystal material enclosed in a planar capsule, one side of which has a flexible outer membrane which is placed on the surface whose pressure and/or temperature is to be measured; a light source used to illuminate the liquid crystal material; and a charge coupled device (CCD) array which detects the variations in the optical signature of the liquid crystal material due to changes in pressure or temperature. The device may further include an optical waveguide for controlling transmission of light from the light source to the liquid crystal material.

    摘要翻译: 利用液晶材料和电荷耦合器件(CCD)传感器阵列的组合的压力或温度传感器阵列。 该装置通常包括封装在平面胶囊中的液晶材料,其一侧具有柔性外膜,其放置在要测量其压力和/或温度的表面上; 用于照亮液晶材料的光源; 以及电荷耦合器件(CCD)阵列,其检测由于压力或温度的变化引起的液晶材料的光学特征的变化。 该装置还可以包括用于控制从光源到液晶材料的光的透射的光波导。

    Systems and methods for detection of dielectric change in material and structure
    10.
    发明授权
    Systems and methods for detection of dielectric change in material and structure 有权
    用于检测材料和结构中电介质变化的系统和方法

    公开(公告)号:US07288945B2

    公开(公告)日:2007-10-30

    申请号:US11201753

    申请日:2005-08-11

    IPC分类号: G01R27/26

    CPC分类号: G01V3/088 H03K17/955

    摘要: Methods and systems are described for efficiently detecting an object. The system includes at least one electrode for measuring a displacement current. The at least one electrode is coupled to a floating ground configuration provided by an op-amp, where the inverting node of the op-amp is coupled to electrode and the non-inverting node is coupled to a signal generator. The system may include a single capacitance sensor for detecting an object. Systems may include a plurality of capacitance sensors in an array configuration for detecting an object.

    摘要翻译: 描述了用于有效检测物体的方法和系统。 该系统包括至少一个用于测量位移电流的电极。 至少一个电极耦合到由运算放大器提供的浮动接地配置,其中运算放大器的反相节点耦合到电极,并且非反相节点耦合到信号发生器。 该系统可以包括用于检测物体的单个电容传感器。 系统可以包括用于检测物体的阵列配置中的多个电容传感器。