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1.
公开(公告)号:US20240340552A1
公开(公告)日:2024-10-10
申请号:US18742377
申请日:2024-06-13
发明人: Atsumi Niwa , Yusuke Oike
IPC分类号: H04N25/772 , H04N25/443 , H04N25/445 , H04N25/47 , H04N25/53 , H04N25/707
CPC分类号: H04N25/772 , H04N25/443 , H04N25/445 , H04N25/47 , H04N25/53 , H04N25/707
摘要: An object is to reduce a circuit scale in a solid-state imaging element that detects an address event. The solid-state imaging element is provided with a plurality of photoelectric conversion elements, a signal supply unit, and a detection unit. In this solid-state imaging element, each of the plurality of photoelectric conversion elements photoelectrically converts incident light to generate a first electric signal. Furthermore, in the solid-state imaging element, the detection unit detects whether or not a change amount of the first electric signal of each of the plurality of photoelectric conversion elements exceeds a predetermined threshold and outputs a detection signal indicating a result of the detection result.
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2.
公开(公告)号:US11936996B2
公开(公告)日:2024-03-19
申请号:US17626960
申请日:2020-07-08
发明人: Atsumi Niwa
IPC分类号: H04N25/50 , H04N25/57 , H04N25/702 , H04N25/74 , H04N25/75 , H04N25/76 , H04N25/77 , H04N25/79
CPC分类号: H04N25/50 , H04N25/702 , H04N25/77 , H04N25/79
摘要: Miniaturization of pixels is facilitated in a solid-state imaging element that detects presence or absence of an address event. The solid-state imaging element includes a plurality of detection pixels and a detection circuit. In the solid-state imaging element including the plurality of detection pixels and the detection circuit, each of the plurality of detection pixels generates a voltage signal according to a logarithmic value of a photocurrent. Furthermore, in the solid-state imaging element including the plurality of detection pixels and the detection circuit, the detection circuit detects whether or not a change amount of a voltage signal of a detection pixel indicated by an input selection signal among the plurality of detection pixels exceeds a predetermined threshold value.
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公开(公告)号:US11895411B2
公开(公告)日:2024-02-06
申请号:US17753713
申请日:2020-07-14
发明人: Atsumi Niwa , Yusuke Oike
IPC分类号: H04N25/40 , H04N25/77 , H04N25/702 , H04N25/703 , H04N25/707 , H04N25/47 , H01L31/107 , H01L29/66 , H01L29/06
摘要: It is an object to extend event signal detection periods. An imaging device according to the present technology includes a solid-state imaging device including a plurality of pixels each including a light-receiving portion that photoelectrically converts incident light to generate an electrical signal and a detection circuit that executes event signal detection by comparing the amount of change in the electrical signal generated by the light-receiving portion with a predetermined threshold value to obtain a detection result, and a control unit that performs control so that different pixels have different timing for an event detection period to cause the detection circuit to execute the event signal detection.
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4.
公开(公告)号:US20240007770A1
公开(公告)日:2024-01-04
申请号:US18142949
申请日:2023-05-03
发明人: Atsumi Niwa , Yusuke Oike
IPC分类号: H04N25/772 , H04N25/53 , H04N25/443 , H04N25/445 , H04N25/707 , H04N25/47
CPC分类号: H04N25/772 , H04N25/53 , H04N25/47 , H04N25/445 , H04N25/707 , H04N25/443
摘要: An object is to reduce a circuit scale in a solid-state imaging element that detects an address event.
The solid-state imaging element is provided with a plurality of photoelectric conversion elements, a signal supply unit, and a detection unit. In this solid-state imaging element, each of the plurality of photoelectric conversion elements photoelectrically converts incident light to generate a first electric signal. Furthermore, in the solid-state imaging element, the detection unit detects whether or not a change amount of the first electric signal of each of the plurality of photoelectric conversion elements exceeds a predetermined threshold and outputs a detection signal indicating a result of the detection result.-
公开(公告)号:US11582408B2
公开(公告)日:2023-02-14
申请号:US16964676
申请日:2018-12-14
发明人: Atsumi Niwa
摘要: In a solid-state image sensor that detects an address event, the detection sensitivity for the address event is controlled to an appropriate value.
The solid-state image sensor includes a pixel array unit and a control unit. In the solid-state image sensor, multiple pixel circuits are arranged in the pixel array unit, each detecting a change in luminance of incident light occurring outside a predetermined dead band as the address event. The control unit controls the width of the dead band according to the number of times the address event is detected in the pixel array unit within a fixed unit cycle.-
公开(公告)号:US11082656B2
公开(公告)日:2021-08-03
申请号:US16484946
申请日:2018-07-17
发明人: Atsumi Niwa
IPC分类号: H04N5/369 , H04N5/3745 , H01L27/146
摘要: To a mounting area in a solid-state imaging device that detects an address event.
The solid-state imaging device includes a light receiving chip and a detection chip. In the solid-state imaging device including the light receiving chip and the detection chip, the light receiving chip includes a photodiode that photoelectrically converts incident light and generates a photocurrent. In addition, in the solid-state imaging device, the detection chip quantizes a voltage signal corresponding to the photocurrent generated by the photodiode in the light receiving chip and outputs the voltage signal as a detection signal.-
公开(公告)号:US11039098B2
公开(公告)日:2021-06-15
申请号:US16488734
申请日:2018-02-19
发明人: Atsumi Niwa , Tomonori Yamashita , Takashi Moue , Yosuke Ueno
IPC分类号: H04N5/3745 , H03K5/24 , H03M1/34 , H04N5/378
摘要: Provided is an image sensor including: a pixel section configured to include a plurality of pixels arranged therein; and an AD conversion unit configured to perform analog-to-digital (AD) conversion on a pixel signal on the basis of a result of comparison between a first voltage of a signal, which is obtained by adding, via capacitances, the pixel signal of the pixel and a reference signal that linearly changes in a direction opposite to the pixel signal, with a second voltage serving as a reference.
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公开(公告)号:US20200053308A1
公开(公告)日:2020-02-13
申请号:US16488734
申请日:2018-02-19
发明人: Atsumi Niwa , Tomonori Yamashita , Takashi Moue , Yosuke Ueno
IPC分类号: H04N5/3745 , H04N5/378 , H03M1/34 , H03K5/24
摘要: Provided is an image sensor including: a pixel section configured to include a plurality of pixels arranged therein; and an AD conversion unit configured to perform analog-to-digital (AD) conversion on a pixel signal on the basis of a result of comparison between a first voltage of a signal, which is obtained by adding, via capacitances, the pixel signal of the pixel and a reference signal that linearly changes in a direction opposite to the pixel signal, with a second voltage serving as a reference.
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公开(公告)号:US12088936B2
公开(公告)日:2024-09-10
申请号:US18003417
申请日:2021-06-28
发明人: Terukazu Tanaka , Atsumi Niwa
IPC分类号: H04N25/57 , H03G3/30 , H04N25/51 , H04N25/778
CPC分类号: H04N25/57 , H03G3/30 , H04N25/51 , H04N25/778 , H03G2201/103
摘要: An imaging device includes pixel circuit including a generation unit generating a voltage; a capacitor having a first electrode to which the voltage is applied; a first amplifier having a first input terminal, connected to a second electrode of the capacitor, and a second input terminal, to which a first reference voltage is applied to, to output a result by comparing the voltage with the first reference voltage; a switch unit controlling a connection between the output of the first amplifier and the first input terminal; and a second amplifier having a third input terminal, to which the output of the first amplifier is connected, and a fourth input terminal, to which a second reference voltage is applied, to output a result by comparing the voltage with the second reference voltage, in which a first gain of the first amplifier is lower than a second gain of the second amplifier.
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公开(公告)号:US11910108B2
公开(公告)日:2024-02-20
申请号:US18153488
申请日:2023-01-12
发明人: Atsumi Niwa , Motonari Honda
IPC分类号: H04N25/40 , H04N25/44 , H04N25/74 , H04N25/75 , H04N25/443 , H04N25/445 , H04N25/00
CPC分类号: H04N25/40 , H04N25/00 , H04N25/44 , H04N25/443 , H04N25/445 , H04N25/74 , H04N25/75
摘要: Time deviation between event detection and gradation acquisition is reduced. A solid-state imaging apparatus according to an embodiment includes: a pixel array unit (300) including a plurality of pixel blocks (310) arrayed in a matrix; and a drive circuit (211) that generates a pixel signal in a first pixel block in which firing of an address event has been detected among the plurality of pixel blocks, each of the plurality of pixel blocks including a first photoelectric conversion element (331) that generates an electric charge according to an amount of incident light, a detection unit (400) that detects the firing of the address event based on the electric charge generated in the first photoelectric conversion element, a second photoelectric conversion element (321) that generates an electric charge according to an amount of incident light, and a pixel circuit (322, 323, 324, 325, 326) that generates a pixel signal based on the electric charge generated in the second photoelectric conversion element.
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