公开(公告)号：US20140232425A1

公开(公告)日：2014-08-21

申请号：US13771889

申请日：2013-02-20

Applicant: SILICON LABORATORIES INC.

Inventor： Larry R. Rose ,  Craig N. Gabelmann ,  Wenshui Zhang

IPC: G01R31/28

CPC classification number: G01R1/0433

Abstract: A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main test printed circuit board (PCB) and a daughter card that is dedicated to a specific device handler and/or a specific package type that can be different from the main test PCB. A pogo block is inserted into a thick frame with an alignment plate for contactor use in which a device under test fits into a recess in the frame through an alignment plate to align the device under test to make contact with electrical contacts of the contactor. The frame and guide plate can be removed and a thinner frame coupled to the contactor, which changes its function to a pogo block assembly.

Abstract translation: 接触器将第一配置中的pogo块用作直接集成电路测试插座，并且可以重新配置接触器以提供弹性块组件以在主测试印刷电路板（PCB）和专用于 特定的设备处理器和/或可以与主测试PCB不同的特定封装类型。 弹簧块插入厚框架中，其具有用于接触器使用的对准板，其中被测试装置通过对准板配合到框架中的凹部中，以对准被测设备以与接触器的电触点接触。 框架和引导板可以被移除，并且更薄的框架联接到接触器，其将其功能改变为弹性块组件。

公开(公告)号：US10698001B2

公开(公告)日：2020-06-30

申请号：US15824128

申请日：2017-11-28

Applicant: Silicon Laboratories Inc.

Inventor： Larry R. Rose ,  Wenshui Zhang

IPC: G01R1/04

Abstract: A modular integrated circuit test fixture integrates the integrated circuit (IC) handler to IC test fixture alignment interface (the alignment plate) into a daughter card subassembly, which reduces the overall rejection rate of devices due to alignment errors. The test fixture has a plurality of daughter card subassemblies for receiving integrated circuits for testing. Each daughter card subassembly is independently removable from the test fixture and includes a daughter card for a particular size and type of integrated circuit, a plurality of sockets electrically and mechanically coupled to the daughter card to receive respective integrated circuits for testing, and an alignment plate to provide alignment between an IC handler and respective ones of the daughter card subassemblies and to provide alignment for one or more manual test lids. The manual test lids are removed for automatic testing using an IC handler.

公开(公告)号：US09274140B2

公开(公告)日：2016-03-01

申请号：US13771889

申请日：2013-02-20

Applicant: SILICON LABORATORIES INC.

Inventor： Larry R. Rose ,  Craig N. Gabelmann ,  Wenshui Zhang

IPC: G01R31/20 ,  G01R1/04

CPC classification number: G01R1/0433

Abstract: A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main test printed circuit board (PCB) and a daughter card that is dedicated to a specific device handler and/or a specific package type that can be different from the main test PCB. A pogo block is inserted into a thick frame with an alignment plate for contactor use in which a device under test fits into a recess in the frame through an alignment plate to align the device under test to make contact with electrical contacts of the contactor. The frame and guide plate can be removed and a thinner frame coupled to the contactor, which changes its function to a pogo block assembly.

Abstract translation: 接触器将第一配置中的pogo块用作直接集成电路测试插座，并且可以重新配置接触器以提供弹性块组件以在主测试印刷电路板（PCB）和专用于 特定的设备处理器和/或可以与主测试PCB不同的特定封装类型。 弹簧块插入厚框架中，其具有用于接触器使用的对准板，其中被测试装置通过对准板配合到框架中的凹部中，以对准被测设备以与接触器的电触点接触。 框架和引导板可以被移除，并且更薄的框架联接到接触器，其将其功能改变为弹性块组件。

公开(公告)号：US20190162755A1

公开(公告)日：2019-05-30

申请号：US15824128

申请日：2017-11-28

Applicant: Silicon Laboratories Inc.

Inventor： Larry R. Rose ,  Wenshui Zhang

IPC: G01R1/04

Abstract: A modular integrated circuit test fixture integrates the integrated circuit (IC) handler to IC test fixture alignment interface (the alignment plate) into a daughter card subassembly, which reduces the overall rejection rate of devices due to alignment errors. The test fixture has a plurality of daughter card subassemblies for receiving integrated circuits for testing. Each daughter card subassembly is independently removable from the test fixture and includes a daughter card for a particular size and type of integrated circuit, a plurality of sockets electrically and mechanically coupled to the daughter card to receive respective integrated circuits for testing, and an alignment plate to provide alignment between an IC handler and respective ones of the daughter card subassemblies and to provide alignment for one or more manual test lids. The manual test lids are removed for automatic testing using an IC handler.