Method And System For Transferring Alignment Marks Between Substrate Systems

    公开(公告)号:US20210351166A1

    公开(公告)日:2021-11-11

    申请号:US17241324

    申请日:2021-04-27

    摘要: A method for transferring alignment marks between substrate systems includes providing a substrate having semiconductor devices and alignment marks in precise alignment with the semiconductor devices; and physically transferring and bonding the semiconductor devices and the alignment marks to a temporary substrate of a first substrate system. The method can also include physically transferring and bonding the semiconductor devices and the alignment marks to a mass transfer substrate of a second substrate system; and physically transferring and bonding the semiconductor devices and the alignment marks to a circuitry substrate of a third substrate system. A system for transferring alignment marks between substrate systems includes the substrate having the semiconductor devices and the alignment marks in precise alignment with the semiconductor devices. The system also includes the first substrate system, and can include the second substrate system and the third substrate system.

    Method and system for transferring alignment marks between substrate systems

    公开(公告)号:US11545474B2

    公开(公告)日:2023-01-03

    申请号:US17241324

    申请日:2021-04-27

    摘要: A method for transferring alignment marks between substrate systems includes providing a substrate having semiconductor devices and alignment marks in precise alignment with the semiconductor devices; and physically transferring and bonding the semiconductor devices and the alignment marks to a temporary substrate of a first substrate system. The method can also include physically transferring and bonding the semiconductor devices and the alignment marks to a mass transfer substrate of a second substrate system; and physically transferring and bonding the semiconductor devices and the alignment marks to a circuitry substrate of a third substrate system. A system for transferring alignment marks between substrate systems includes the substrate having the semiconductor devices and the alignment marks in precise alignment with the semiconductor devices. The system also includes the first substrate system, and can include the second substrate system and the third substrate system.

    Method and system for transferring alignment marks between substrate systems

    公开(公告)号:US12002792B2

    公开(公告)日:2024-06-04

    申请号:US17989770

    申请日:2022-11-18

    摘要: A method for transferring alignment marks between substrate systems includes providing a substrate having semiconductor devices and alignment marks in precise alignment with the semiconductor devices; and physically transferring and bonding the semiconductor devices and the alignment marks to a temporary substrate of a first substrate system. The method can also include physically transferring and bonding the semiconductor devices and the alignment marks to a mass transfer substrate of a second substrate system; and physically transferring and bonding the semiconductor devices and the alignment marks to a circuitry substrate of a third substrate system. A system for transferring alignment marks between substrate systems includes the substrate having the semiconductor devices and the alignment marks in precise alignment with the semiconductor devices. The system also includes the first substrate system, and can include the second substrate system and the third substrate system.

    Method And System For Transferring Alignment Marks Between Substrate Systems

    公开(公告)号:US20230134997A1

    公开(公告)日:2023-05-04

    申请号:US17989770

    申请日:2022-11-18

    摘要: A method for transferring alignment marks between substrate systems includes providing a substrate having semiconductor devices and alignment marks in precise alignment with the semiconductor devices; and physically transferring and bonding the semiconductor devices and the alignment marks to a temporary substrate of a first substrate system. The method can also include physically transferring and bonding the semiconductor devices and the alignment marks to a mass transfer substrate of a second substrate system; and physically transferring and bonding the semiconductor devices and the alignment marks to a circuitry substrate of a third substrate system. A system for transferring alignment marks between substrate systems includes the substrate having the semiconductor devices and the alignment marks in precise alignment with the semiconductor devices. The system also includes the first substrate system, and can include the second substrate system and the third substrate system.

    SILICONE ADHESIVE FOR SEMICONDUCTOR ELEMENT
    10.
    发明申请
    SILICONE ADHESIVE FOR SEMICONDUCTOR ELEMENT 有权
    硅胶用于半导体元件

    公开(公告)号:US20130146939A1

    公开(公告)日:2013-06-13

    申请号:US13762880

    申请日:2013-02-08

    IPC分类号: H01L33/56

    CPC分类号: H01L33/56 C09J183/14

    摘要: A silicone adhesive for a semiconductor element that is suitable as a die bonding material for fixing a light emitting diode chip to a substrate. The adhesive includes (a) an addition reaction-curable silicone resin composition having a viscosity at 25° C. of not more than 100 Pa·s, and yielding a cured product upon heating at 150° C. for 3 hours that has a type D hardness prescribed in JIS K6253 of at least 30, (b) a white pigment powder having an average particle size of less than 1 μm, and (c) a white or colorless and transparent powder having an average particle size of at least 1 μm but less than 10 μm. The adhesive exhibits high levels of concealment, effectively reflects light emitted from the LED chip, and also exhibits favorable chip positioning properties, superior adhesive strength, and excellent durability.

    摘要翻译: 一种用于半导体元件的硅粘合剂,其适合作为用于将发光二极管芯片固定到基板的芯片接合材料。 粘合剂包括(a)在25℃下的粘度为100Pa·s以下的加成反应固化型有机硅树脂组合物,在150℃加热3小时时产生固化物, JIS K6253规定的D硬度为30以上,(b)平均粒径小于1μm的白色颜料粉末,(c)平均粒径为1μm以上的白色或无色透明粉末 但少于10个妈妈。 粘合剂显示出高水平的隐蔽性,有效地反映了从LED芯片发出的光,并且还显示出有利的芯片定位性能,优异的粘合强度和优异的耐久性。