PROBATION BIT FOR DATA STORAGE MEMORY
    1.
    发明申请

    公开(公告)号:US20190378589A1

    公开(公告)日:2019-12-12

    申请号:US16263640

    申请日:2019-01-31

    Abstract: A data storage system can receive a data write request to write data to a physical address of a non-volatile semiconductor memory prior to detecting an error while storing the write data to the physical address. The detected error is corrected with a monitor module connected to the non-volatile semiconductor memory and a counter associated with the physical address is incremented with the monitor module in response to the corrected error. The write data can be subsequently read to a host in response to a data read request.

    Staggered garbage collection unit (GCU) allocation across dies

    公开(公告)号:US11334481B2

    公开(公告)日:2022-05-17

    申请号:US16947804

    申请日:2020-08-18

    Abstract: Apparatus and method for managing a non-volatile memory (NVM) such as a flash memory in a solid-state drive (SSD). In some embodiments, the NVM is arranged as a plurality of semiconductor memory dies coupled to a controller circuit using a plurality of channels. The controller circuit divides the plurality of dies into a succession of garbage collection units (GCUs). Each GCU is independently erasable and allocatable for storage of user data. The GCUs are staggered so that each GCU is formed from a different subset of the dies in the NVM. In further embodiments, the dies are arranged into NVM sets in accordance with the NVMe (Non-Volatile Memory Express) specification with each NVM set addressable by a different user for storage of data in a separate set of staggered GCUs.

    Providing additional parity for non-standard sized parity data sets

    公开(公告)号:US11138069B2

    公开(公告)日:2021-10-05

    申请号:US16212242

    申请日:2018-12-06

    Abstract: Apparatus and method for storing data in a non-volatile memory (NVM), such as a flash memory in a solid-state drive (SSD). In some embodiments, a distributed storage space of the NVM is defined to extend across a plural number of regions of the NVM. A non-standard parity data set is provided having a plural number of data elements greater than or equal to the plural number of regions in the storage space. The data set is written by storing a first portion of the data elements and a first parity value to the plural number of regions and a remaining portion of the data elements and a second parity value to a subset of the plural number of regions. The regions can comprise semiconductor dies in a flash memory, and the distributed storage space can be a garbage collection unit formed using one erasure block from each flash die.

    STAGGERED GARBAGE COLLECTION UNIT (GCU) ALLOCATION ACROSS DIES

    公开(公告)号:US20200379903A1

    公开(公告)日:2020-12-03

    申请号:US16947804

    申请日:2020-08-18

    Abstract: Apparatus and method for managing a non-volatile memory (NVM) such as a flash memory in a solid-state drive (SSD). In some embodiments, the NVM is arranged as a plurality of semiconductor memory dies coupled to a controller circuit using a plurality of channels. The controller circuit divides the plurality of dies into a succession of garbage collection units (GCUs). Each GCU is independently erasable and allocatable for storage of user data. The GCUs are staggered so that each GCU is formed from a different subset of the dies in the NVM. In further embodiments, the dies are arranged into NVM sets in accordance with the NVMe (Non-Volatile Memory Express) specification with each NVM set addressable by a different user for storage of data in a separate set of staggered GCUs.

    Data storage device with wear range optimization

    公开(公告)号:US11301376B2

    公开(公告)日:2022-04-12

    申请号:US16263606

    申请日:2019-01-31

    Abstract: A data storage device can be arranged with a semiconductor memory having a plurality of erasure blocks accessed by a controller to store data. An access count for each respective erasure block can be generated to allow a wear range for the semiconductor memory to be computed based on the respective access counts with the controller. A performance impact of the wear range is evaluated with the controller in order to intelligently alter a deterministic window of a first erasure block of the plurality of erasure blocks in response to the performance impact.

    COLLECTION OF UNCORRELATED ENTROPY DURING A POWER DOWN SEQUENCE

    公开(公告)号:US20200004971A1

    公开(公告)日:2020-01-02

    申请号:US16021823

    申请日:2018-06-28

    Abstract: Apparatus and method for managing entropy in a cryptographic processing system, such as but not limited to a solid-state drive (SSD). In some embodiments, a processing device is operated to transfer data between a host device and a non-volatile memory (NVM). In response to the detection of a power down event associated with the processing device, entropy associated with the power down event is collected and stored in a memory. Upon a subsequent reinitialization of the processing device, the entropy is conditioned and used as an input to a cryptographic function to subsequently transfer data between the host device and the NVM. In some embodiments, the entropy is obtained from the state of a hardware timer that provides a monotonically increasing count for timing control. In other embodiments, the entropy is obtained from a RAID buffer used to store data to a die set of the NVM.

    STAGGERED GARBAGE COLLECTION UNIT (GCU) ALLOCATION ACROSS DIES

    公开(公告)号:US20200004676A1

    公开(公告)日:2020-01-02

    申请号:US16022822

    申请日:2018-06-29

    Abstract: Apparatus and method for managing a non-volatile memory (NVM) such as a flash memory in a solid-state drive (SSD). In some embodiments, the NVM is arranged as a plurality of semiconductor memory dies coupled to a controller circuit using a plurality of channels. The controller circuit divides the plurality of dies into a succession of garbage collection units (GCUs). Each GCU is independently erasable and allocatable for storage of user data. The GCUs are staggered so that each GCU is formed from a different subset of the dies in the NVM. In further embodiments, the dies are arranged into NVM sets in accordance with the NVMe (Non-Volatile Memory Express) specification with each NVM set addressable by a different user for storage of data in a separate set of staggered GCUs.

    SEMICONDUCTOR DIE FAILURE RECOVERY IN A DATA STORAGE DEVICE

    公开(公告)号:US20220138065A1

    公开(公告)日:2022-05-05

    申请号:US17516072

    申请日:2021-11-01

    Abstract: Apparatus and method for a die kill and recovery sequence for a non-volatile memory (NVM). Data are stored in the NVM as data sets in garbage collection units (GCUs) that span multiple semiconductor dies. A die failure management circuit is configured to detect a die failure event associated with a selected die, and to generate a recovery strategy to accommodate the detected die failure event by selecting recovery actions to be taken in a selected sequence to maintain a current level of data transfer performance with a client device. The selected recovery actions are carried out in the selected sequence to transfer at least a portion of the user data stored in the selected die to a new replacement die, after which the selected die is decommissioned from further use. The NVM may be a flash memory of a solid-state drive (SSD).

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