SURFACE FEATURES MAPPING
    1.
    发明申请
    SURFACE FEATURES MAPPING 审中-公开
    表面特征绘图

    公开(公告)号:US20150219569A1

    公开(公告)日:2015-08-06

    申请号:US14685899

    申请日:2015-04-14

    Abstract: Provided herein is an apparatus, including a light source configured to illuminate a surface of an article, wherein light incident upon the surface of the article is collimated light; a light detector array including a plurality of light sensors configured to receive scattered light from features about the surface of the article; and a processing means for mapping the features about the surface of the article, wherein the processing means is configured to map the features by analyzing the scattered light received at the light detector array.

    Abstract translation: 本文提供了一种装置,包括被配置为照亮物品表面的光源,其中入射在物品表面上的光是准直的光; 光检测器阵列,包括多个光传感器,其被配置为从物体的表面附近的特征接收散射的光; 以及用于映射关于物品表面的特征的处理装置,其中处理装置被配置为通过分析在光检测器阵列处接收的散射光来映射特征。

    SURFACE FEATURES MAPPING
    2.
    发明申请
    SURFACE FEATURES MAPPING 审中-公开
    表面特征绘图

    公开(公告)号:US20160363540A1

    公开(公告)日:2016-12-15

    申请号:US15245049

    申请日:2016-08-23

    Abstract: Provided herein is an apparatus, including a light source configured to illuminate a surface of an article. In addition, the apparatus includes a light detector array. The light detector array includes a number of light sensors configured to simultaneously receive scattered light from features about the entire surface. The light detector array is configured to provide information for qualitatively and quantitatively characterizing the features.

    Abstract translation: 本文提供了一种装置,包括被配置为照亮物品表面的光源。 另外,该装置包括一个光检测器阵列。 光检测器阵列包括多个光传感器,其被配置为同时从特征围绕整个表面接收散射光。 光检测器阵列被配置为提供用于定性和定量地表征特征的信息。

    SURFACE FEATURES MAPPING
    4.
    发明申请
    SURFACE FEATURES MAPPING 有权
    表面特征绘图

    公开(公告)号:US20130301040A1

    公开(公告)日:2013-11-14

    申请号:US13890470

    申请日:2013-05-09

    Abstract: Provided herein is an apparatus, including a photon emitting means for emitting photons onto a surface of an article, a photon detecting means for detecting photons scattered from features in the surface of the article; and a mapping means for mapping the features in the surface of the article, wherein the apparatus is configured to process more than one article every 100 seconds.

    Abstract translation: 本文提供了一种装置,包括用于将光子发射到物品的表面上的光子发射装置,用于检测从制品的表面中的特征散射的光子的光子检测装置; 以及用于映射制品表面中的特征的映射装置,其中该装置被配置为每100秒处理多于一个物品。

    Surface features mapping
    5.
    发明授权
    Surface features mapping 有权
    表面特征映射

    公开(公告)号:US09488593B2

    公开(公告)日:2016-11-08

    申请号:US14685899

    申请日:2015-04-14

    Abstract: Provided herein is an apparatus, including a light source configured to illuminate a surface of an article, wherein light incident upon the surface of the article is collimated light; a light detector array including a plurality of light sensors configured to receive scattered light from features about the surface of the article; and a processing means for mapping the features about the surface of the article, wherein the processing means is configured to map the features by analyzing the scattered light received at the light detector array.

    Abstract translation: 本文提供了一种装置,包括被配置为照亮物品表面的光源,其中入射在物品表面上的光是准直的光; 光检测器阵列,包括多个光传感器,其被配置为从物体的表面附近的特征接收散射的光; 以及用于映射关于物品表面的特征的处理装置,其中处理装置被配置为通过分析在光检测器阵列处接收的散射光来映射特征。

Patent Agency Ranking