知搜-全球专利检索

  1. Login
  2. Sign Up

Search Results

5 records (took 0.019 seconds)

    SEMICONDUCTOR DEVICES
    3.
    发明申请
    SEMICONDUCTOR DEVICES 有权

    公开(公告)号：US20220406939A1

    公开(公告)日：2022-12-22

    申请号：US17667753

    申请日：2022-02-09

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jong Pil Kim ,  Wook Hyun Kwon

    IPC: H01L29/78 ,  H01L29/417

    Abstract: The present disclosure provides a semiconductor device with improved element performance and reliability. The semiconductor device includes a lower insulating layer, a fin-shaped insulating layer that is on the lower insulating layer and extends in a first direction, a field insulating layer that is on the lower insulating layer and extends in the first direction, a plurality of gate structures that are on the fin-shaped insulating layer and include a gate electrode intersecting the fin-shaped insulating layer, a source/drain region that is on the fin-shaped insulating layer and is between the gate structures, and an active pattern that is on the fin-shaped insulating layer and penetrates the gate electrode and is electrically connected to the source/drain region, where the gate electrode extends in a second direction intersecting the first direction.

    X-ray imaging apparatus and control method therefor
    5.
    发明授权
    X-ray imaging apparatus and control method therefor 有权
    X射线成像装置及其控制方法

    公开(公告)号：US09414801B2

    公开(公告)日：2016-08-16

    申请号：US14193791

    申请日：2014-02-28

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jong Pil Kim ,  So Dam Baek

    IPC: A61B6/06 ,  G21K1/04 ,  H01J35/02 ,  G01B7/32 ,  G06G7/04 ,  H01L23/64 ,  A61B6/04 ,  A61B5/00 ,  A61B6/00 ,  A61B5/103 ,  A61B5/107 ,  B25J9/16 ,  A61B5/053 ,  G01B7/00

    CPC classification number: A61B6/544 ,  A61B5/053 ,  A61B5/0531 ,  A61B5/103 ,  A61B5/107 ,  A61B5/6887 ,  A61B5/708 ,  A61B6/0414 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/469 ,  A61B6/502 ,  A61B6/5252 ,  A61B6/542 ,  A61B6/545 ,  B25J9/1694 ,  G01B7/003 ,  G01B7/32 ,  G06G7/04 ,  G21K1/046 ,  H01J35/025 ,  H01L23/642 ,  H01L23/647 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: Disclosed herein are an X-ray imaging apparatus and a control method therefor in which a region of a compressed breast is measured by a touch sensor and a collimator is controlled such that an X-ray emission region corresponds to the measured region of a compressed breast, whereby workflow for performing X-ray imaging may be reduced and subject pain due to breast compression may be alleviated. The X-ray imaging apparatus includes an X-ray source to generate X-rays and irradiate an object with the generated X-rays, a collimator to adjust an emission region of the X-rays generated from the X-ray source, an X-ray detector to detect X-rays having passed through the object to acquire X-ray data, a touch sensor disposed above the X-ray detector, a compression paddle to compress the object placed on the touch sensor, and a collimator control unit to calculate location and size of the compressed object based on an output value of the touch sensor and control the collimator based on calculation results.

    Abstract translation: 本文公开了一种X射线成像设备及其控制方法，其中通过触摸传感器测量压缩乳房的区域，并且对准直仪进行控制，使得X射线发射区域对应于压缩乳房的测量区域 从而可以减少用于执行X射线成像的工作流程，并且可以减轻由于乳房压缩引起的受试者疼痛。 X射线成像装置包括：X射线源，用于产生X射线并用生成的X射线照射物体;准直器，用于调整从X射线源产生的X射线的发射区域; X 射线检测器，用于检测已经穿过物体的X射线以获取X射线数据，设置在X射线检测器上方的触摸传感器，压缩板，以压缩放置在触摸传感器上的物体;准直器控制单元， 基于触摸传感器的输出值计算压缩对象的位置和大小，并根据计算结果控制准直仪。

Patent Agency Ranking