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公开(公告)号:US09892884B2
公开(公告)日:2018-02-13
申请号:US15157407
申请日:2016-05-18
发明人: Rae-Won Yi , Byoung-Sup Ahn , Dong-Gun Lee , Su-Young Lee
IPC分类号: H01J37/00 , H01J37/02 , H01J37/244 , H01J37/20
CPC分类号: H01J37/023 , H01J37/20 , H01J37/244 , H01J2237/20285 , H01J2237/20292 , H01J2237/24578
摘要: An exposure apparatus comprising, a stage configured to receive a substrate, a mark array disposed on the stage and comprising a first mark and a second mark separated from each other by a first distance, a first beam irradiator configured to irradiate a first beam to the first mark, a second beam irradiator being separated from the first beam by a pitch greater than the first distance and configured to irradiate a second beam to the second mark, a detector disposed over the mark array and configured to receive a third beam reflected by the first mark and a fourth beam reflected by the second mark, and a controller configured to control the position of the stage using an output of the detector.