- 专利标题: Exposure apparatus and method of manufacturing semiconductor device
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申请号: US15157407申请日: 2016-05-18
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公开(公告)号: US09892884B2公开(公告)日: 2018-02-13
- 发明人: Rae-Won Yi , Byoung-Sup Ahn , Dong-Gun Lee , Su-Young Lee
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Law, PLLC
- 优先权: KR10-2015-0117198 20150820
- 主分类号: H01J37/00
- IPC分类号: H01J37/00 ; H01J37/02 ; H01J37/244 ; H01J37/20
摘要:
An exposure apparatus comprising, a stage configured to receive a substrate, a mark array disposed on the stage and comprising a first mark and a second mark separated from each other by a first distance, a first beam irradiator configured to irradiate a first beam to the first mark, a second beam irradiator being separated from the first beam by a pitch greater than the first distance and configured to irradiate a second beam to the second mark, a detector disposed over the mark array and configured to receive a third beam reflected by the first mark and a fourth beam reflected by the second mark, and a controller configured to control the position of the stage using an output of the detector.
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