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公开(公告)号:US20240136396A1
公开(公告)日:2024-04-25
申请号:US18141990
申请日:2023-04-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jiho Yoo , Kihyung Ko , Junsoo Kim , Hyunsup Kim , Jihoon Cha
CPC classification number: H01L29/0653 , H01L29/66439 , H01L29/66545 , H01L29/66742 , H01L29/775
Abstract: A semiconductor device may include an active pattern on a substrate; an isolation pattern on the substrate, the isolation pattern covering opposite sidewalls of the active pattern; a liner on the isolation pattern, a liner including a material different from the isolation pattern; a gate structure contacting an upper surface of the active pattern and an upper surface of the liner; and a plurality of channels spaced apart from each other in a vertical direction perpendicular to an upper surface of the substrate, each of the plurality of channels extending through the gate structure.
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公开(公告)号:US11720791B2
公开(公告)日:2023-08-08
申请号:US16887062
申请日:2020-05-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngchun Kwon , Jinwoo Park , Dongseon Lee , Youngmin Nam , Minsik Park , Jiho Yoo , Younsuk Choi
Abstract: An apparatus for optimizing experimental conditions by using a neural network may calculate a prediction yield and accuracy of the prediction yield by using a neural network-based experimental prediction model. The apparatus may optimize the experimental conditions by determining an experiment priority of a respective experiment condition combination based on the prediction yield and the prediction accuracy and receiving a feedback of results of experiments performed according to the experiment priority.
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公开(公告)号:US10957419B2
公开(公告)日:2021-03-23
申请号:US15664960
申请日:2017-07-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jiho Yoo , Seokho Kang , Youngchun Kwon , Kyung doc Kim , Jaikwang Shin , Hyosug Lee , Younsuk Choi
Abstract: A structure-generating method for generating a structure candidate of a new material including: by a structure-generating processor: performing machine learning on a machine learning model, wherein the machine learning model is configured to provide a result based on a descriptor of a material, a physical property of the material, and a structure of the material; and generating a structure candidate of the new material based on the result of the machine learning, wherein the new material has a target physical property, and wherein the descriptor of the material, the physical property of the material, and the structure of the material are stored in a database.
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公开(公告)号:US20230068364A1
公开(公告)日:2023-03-02
申请号:US17718924
申请日:2022-04-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kyungin Choi , Dongmyoung Kim , Haejun Yu , Ki-Hyung Ko , Jiho Yoo , Soonwook Jung
IPC: H01L29/786 , H01L27/092 , H01L29/06 , H01L29/423 , H01L21/02 , H01L21/8238 , H01L29/66
Abstract: A semiconductor device includes an active pattern provided on a substrate, a source/drain pattern provided on the active pattern, a channel pattern configured to be connected to the source/drain pattern, a gate electrode configured to be extended in a first direction and to cross the channel pattern, and a first spacer provided on a side surface of the gate electrode. The first spacer includes a fence portion provided on a side surface of the active pattern and below the source/drain pattern. The source/drain pattern includes a body portion and a neck portion between the body portion and the active pattern. The body portion includes a crystalline surface configured to be slantingly extended from the neck portion. The crystalline surface is configured to be spaced apart from an uppermost portion of the fence portion.
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公开(公告)号:US11581067B2
公开(公告)日:2023-02-14
申请号:US16156709
申请日:2018-10-10
Inventor: Youngchun Kwon , Seokho Kang , Kyungdoc Kim , Jiho Yoo , Younsuk Choi
IPC: G16C20/40 , G06N3/04 , G06N3/08 , G16C20/80 , G16C20/50 , G16C20/70 , G16C20/00 , G06N3/06 , G16C99/00 , G06N3/02 , G16C60/00 , G16B15/00 , G01N37/00 , G16C20/20 , G16C20/30 , G06N3/12 , G06N3/126
Abstract: A method of generating a chemical structure performed by a neural network device includes receiving a target property value and a target structure characteristic value; selecting first generation descriptors; generating second generation descriptors; determining, using a first neural network of the neural network device, property values of the second generation descriptors; determining, using a second neural network of the neural network device, structure characteristic values of the second generation descriptors; selecting, from the second generation descriptors, candidate descriptors that satisfy the target property value and the target structure characteristic value; and generating, using the second neural network of the neural network device, chemical structures for the selected candidate descriptors.
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公开(公告)号:US20200083464A1
公开(公告)日:2020-03-12
申请号:US16555257
申请日:2019-08-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyeonho Choi , Kyuyoung Hwang , Seungyeon Kwak , Youngmin Nam , Kum Hee LEE , Aram Jeon , Whail Choi , Kyungdoc Kim , Jiho Yoo , Younsuk Choi
Abstract: An organometallic compound represented by Formula 1: M(L1)n1(L2)n2 Formula 1 wherein, in Formula 1, M, L1, L2, n1 and n2 are each the same as defined in the detailed description of the specification.
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公开(公告)号:US20240421207A1
公开(公告)日:2024-12-19
申请号:US18670738
申请日:2024-05-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jiho Yoo , Kihyung Ko , Jihoon Cha
IPC: H01L29/423 , H01L23/528 , H01L29/06 , H01L29/08 , H01L29/66 , H01L29/775 , H01L29/786
Abstract: A semiconductor device includes a substrate insulating layer having a lower insulating pattern protruding from an upper surface of the substrate insulating layer and extending in a first direction; a semiconductor pattern extending on the lower insulating pattern of the substrate insulating layer in the first direction; a plurality of channel layers stacked on the semiconductor pattern and spaced apart from each other in a direction perpendicular to the upper surface of the substrate insulating layer; a gate structure intersecting the semiconductor pattern, extending in a second direction crossing the first direction, and surrounding the plurality of channel layers; first and second source/drain regions disposed on the semiconductor pattern on both sides of the gate structure; and an intermediate insulating pattern disposed between the lower insulating pattern and the semiconductor pattern and having a thickness equal to or less than a distance between the plurality of channel layers.
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公开(公告)号:US11450410B2
公开(公告)日:2022-09-20
申请号:US16402410
申请日:2019-05-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jiho Yoo , Youngmin Nam , Dongseon Lee , Younsuk Choi , Youngchun Kwon , Kyungdoc Kim
Abstract: A method of generating a molecular structure includes generating, based on a predetermined number of a plurality of nodes, all possible two-dimensional (2D) graphs and a plurality of edges representing connections between the plurality of nodes and, for each 2D graph from among the generated 2D graphs, generating all possible molecular structures based on the 2D graph by substituting each of the plurality of nodes with a polygonal ring structure including carbon atoms and substituting the edges with bonds between polygonal ring structures. Also, a method includes substituting at least one of carbon atoms included in the polygonal ring structures with an atom other than a carbon atom.
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公开(公告)号:US10944063B2
公开(公告)日:2021-03-09
申请号:US16057929
申请日:2018-08-08
Applicant: Samsung Electronics Co., Ltd. , Samsung SDI Co., Ltd.
Inventor: Dmitry Kravchuk , Wook Kim , Juhyun Kim , Changho Noh , Sangho Park , Satoko Ishibe , Seokho Kang , Inkoo Kim , Jiho Yoo , Dongseon Lee , Hasup Lee , Jun Chwae
Abstract: An organometallic compound represented by Formula 1: wherein, in Formula 1, groups and variables are the same as described in the specification.
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公开(公告)号:US10325992B2
公开(公告)日:2019-06-18
申请号:US14854272
申请日:2015-09-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Eunae Cho , Dongjin Lee , Ji Eun Lee , Kyoung-Ho Jung , Dong Su Ko , Yongsu Kim , Jiho Yoo , Sung Heo , Hyun Park , Satoru Yamada , Moonyoung Jeong , Sungjin Kim , Gyeongsu Park , Han Jin Lim
IPC: H01L29/423 , H01L29/49 , H01L21/28 , H01L29/51
Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a substrate including a trench. The semiconductor device further includes a gate electrode disposed in the trench, and a gate insulating film disposed between the substrate and the gate electrode. The gate electrode includes a gate conductor and a metal element, and an effective work function of the gate electrode is less than an effective work function of the gate conductor.
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