Abstract:
An image sensor includes a first column pair and a second column pair among a plurality of columns of a pixel array, an analog-to-digital converter pair, and a switch arrangement circuit configured to connect the first column pair with the analog-to-digital converter pair in response to first switch control signals such that two rows among a plurality of rows in the pixel array are read during a single access time.
Abstract:
An electronic device includes a pixel array that outputs a raw image including color pixels and specific pixels, a logic circuit that outputs a first binned image by performing first binning on pixels in a row direction for each unit kernel of the raw image, and a processor that outputs a second binned image by performing second binning on the first binned image. When a unit kernel includes at least one of the specific pixels, a column to which the at least one specific pixel belongs is read out at a readout timing different from a readout timing of a column to which none of the specific pixels belong and undergoes the first binning. The second binning combines a third binned image of the column to which none of the specific pixels belong with a fourth binned image of the column to which the at least one specific pixel belongs.
Abstract:
A sub pixel includes a photodetector and a column line output circuit. The photodetector is configured to output an electrical signal based on a detected amount of photons. The column line output circuit is configured to generate an output signal based on the electrical signal. The output signal is one of a current from a current source and a comparison signal indicative of binary output data.