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公开(公告)号:US09053948B2
公开(公告)日:2015-06-09
申请号:US14256232
申请日:2014-04-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyoung-Hee Kim , Ho-Ki Lee , Gilheyun Choi , Kyu-Hee Han , Jongwon Hong
IPC: H01L29/06 , H01L21/764 , H01L23/522 , H01L23/532
CPC classification number: H01L29/0649 , H01L21/764 , H01L21/7682 , H01L23/5222 , H01L23/53238 , H01L23/53266 , H01L23/5329 , H01L23/53295 , H01L2221/1047 , H01L2924/0002 , H01L2924/00
Abstract: A semiconductor device can include wiring lines on a substrate and an interlayer insulating structure, between ones of the wiring lines. The wiring lines can include a pore-containing layer that includes a plurality of pores extending away from a surface of the substrate, wherein ones of the pores have respective volumes that increase with a distance from the substrate until reaching an air gap layer above the pore-containing layer and beneath uppermost surfaces of the wiring lines.
Abstract translation: 半导体器件可以包括衬底上的布线和层间绝缘结构,在布线之间。 布线可以包括含孔层,其包括远离衬底表面延伸的多个孔,其中孔中的一些孔具有随着与衬底的距离而增加的体积,直到达到孔的上方的气隙层 并且在布线的最上表面之下。
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公开(公告)号:US20140312456A1
公开(公告)日:2014-10-23
申请号:US14256232
申请日:2014-04-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyoung-Hee Kim , Ho-Ki Lee , Gilheyun Choi , Kyu-Hee Han , Jongwon Hong
IPC: H01L29/06 , H01L23/535
CPC classification number: H01L29/0649 , H01L21/764 , H01L21/7682 , H01L23/5222 , H01L23/53238 , H01L23/53266 , H01L23/5329 , H01L23/53295 , H01L2221/1047 , H01L2924/0002 , H01L2924/00
Abstract: A semiconductor device can include wiring lines on a substrate and an interlayer insulating structure, between ones of the wiring lines. The wiring lines can include a pore-containing layer that includes a plurality of pores extending away from a surface of the substrate, wherein ones of the pores have respective volumes that increase with a distance from the substrate until reaching an air gap layer above the pore-containing layer and beneath uppermost surfaces of the wiring lines.
Abstract translation: 半导体器件可以包括衬底上的布线和层间绝缘结构,在布线之间。 布线可以包括含孔层,其包括远离衬底表面延伸的多个孔,其中孔中的一些孔具有随着与衬底的距离而增加的体积,直到达到孔的上方的气隙层 并且在布线的最上表面之下。
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