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公开(公告)号:US12176308B2
公开(公告)日:2024-12-24
申请号:US18459628
申请日:2023-09-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngkyu Lim , Gookmi Song , Sunguk Lee
IPC: H01L23/00
Abstract: A package substrate may include an insulation substrate, at least one redistribution layer (RDL) and a redistribution pad. The RDL may be included in the insulation substrate. The redistribution pad may extend from the RDL. The redistribution pad may include at least one segmenting groove in a radial direction of the redistribution pad. Thus, the at least one segmenting groove in the radial direction of the redistribution pad may reduce an area of the redistribution pad. Therefore, application of physical stress to a PID disposed over the redistribution pad may be suppressed, and thus generation of cracks in the PID may be reduced. Further, spreading of the cracks toward the redistribution pad from the PID may also be suppressed, and thus reliability the semiconductor package may be improved.
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公开(公告)号:US11894333B2
公开(公告)日:2024-02-06
申请号:US17401664
申请日:2021-08-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dahee Kim , Jeongrim Seo , Gookmi Song
IPC: H01L23/31 , H01L23/00 , H01L23/538 , H01L21/48 , H01L25/10
CPC classification number: H01L24/20 , H01L21/4853 , H01L21/4857 , H01L23/3128 , H01L23/5383 , H01L23/5386 , H01L23/5389 , H01L24/19 , H01L25/105 , H01L2224/214 , H01L2224/2105 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/3512
Abstract: A semiconductor package includes: a redistribution substrate including a connection via and a redistribution layer electrically connected to each other, and a redistribution pad electrically connected to the redistribution layer by the connection via, a space pattern separating at least some of the redistribution pads from each other, a dummy metal pattern at least partially surrounded by the space pattern, and a degassing opening passing through at least one of the redistribution pad and the dummy metal pattern; a connection bump electrically connected to the redistribution pad; and a semiconductor chip on the redistribution substrate and including a connection pad electrically connected to the redistribution layer, the redistribution pad including a plurality of protrusions protruding from the same plane in directions different from each other and having a corner having a rounded shape, and the dummy metal pattern includes branch patterns each extending in directions different from one another.
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公开(公告)号:US11756908B2
公开(公告)日:2023-09-12
申请号:US17718639
申请日:2022-04-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngkyu Lim , Gookmi Song , Sunguk Lee
IPC: H01L23/00
CPC classification number: H01L24/05 , H01L24/20 , H01L2224/0401 , H01L2224/05011 , H01L2924/3512
Abstract: A package substrate may include an insulation substrate, at least one redistribution layer (RDL) and a redistribution pad. The RDL may be included in the insulation substrate. The redistribution pad may extend from the RDL. The redistribution pad may include at least one segmenting groove in a radial direction of the redistribution pad. Thus, the at least one segmenting groove in the radial direction of the redistribution pad may reduce an area of the redistribution pad. Therefore, application of physical stress to a PID disposed over the redistribution pad may be suppressed, and thus generation of cracks in the PID may be reduced. Further, spreading of the cracks toward the redistribution pad from the PID may also be suppressed, and thus reliability the semiconductor package may be improved.
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公开(公告)号:US20220165698A1
公开(公告)日:2022-05-26
申请号:US17401664
申请日:2021-08-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dahee Kim , Jeongrim Seo , Gookmi Song
IPC: H01L23/00 , H01L25/10 , H01L23/31 , H01L23/538 , H01L21/48
Abstract: A semiconductor package includes: a redistribution substrate including a connection via and a redistribution layer electrically connected to each other, and a redistribution pad electrically connected to the redistribution layer by the connection via, a space pattern separating at least some of the redistribution pads from each other, a dummy metal pattern at least partially surrounded by the space pattern, and a degassing opening passing through at least one of the redistribution pad and the dummy metal pattern; a connection bump electrically connected to the redistribution pad; and a semiconductor chip on the redistribution substrate and including a connection pad electrically connected to the redistribution layer, the redistribution pad including a plurality of protrusions protruding from the same plane in directions different from each other and having a corner having a rounded shape, and the dummy metal pattern includes branch patterns each extending in directions different from one another.
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公开(公告)号:US11302661B2
公开(公告)日:2022-04-12
申请号:US16930517
申请日:2020-07-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngkyu Lim , Gookmi Song , Sunguk Lee
IPC: H01L23/00
Abstract: A package substrate may include an insulation substrate, at least one redistribution layer (RDL) and a redistribution pad. The RDL may be included in the insulation substrate. The redistribution pad may extend from the RDL. The redistribution pad may include at least one segmenting groove in a radial direction of the redistribution pad. Thus, the at least one segmenting groove in the radial direction of the redistribution pad may reduce an area of the redistribution pad. Therefore, application of physical stress to a PID disposed over the redistribution pad may be suppressed, and thus generation of cracks in the PID may be reduced. Further, spreading of the cracks toward the redistribution pad from the PID may also be suppressed, and thus reliability the semiconductor package may be improved.
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