公开(公告)号：US20240310873A1

公开(公告)日：2024-09-19

申请号：US18668400

申请日：2024-05-20

Applicant: Samsung Display Co., LTD.

Inventor： Kyung-Mok LEE ,  HOJIN KANG ,  MINSUNG KWON ,  Dong-Youb LEE ,  Suk-Ho LEE ,  HIROTSUGU KISHIMOTO

IPC: G06F1/16 ,  G09G3/3225 ,  H10K50/842

CPC classification number: G06F1/1616 ,  G09G3/3225 ,  H10K50/8426

Abstract: A display device includes a folding area at which the display device is foldable; a first non-folding area and a second non-folding area opposing each other with the folding area therebetween; a display panel; an adhesive member having a thickness of about 15 micrometers to about 18 micrometers; and a protective film facing the display panel with the adhesive member having the thickness of about 15 micrometers to about 18 micrometers therebetween, the adhesive member coupling the protective film to the display panel.

公开(公告)号：US20210055760A1

公开(公告)日：2021-02-25

申请号：US16996990

申请日：2020-08-19

Applicant: Samsung Display Co., LTD.

Inventor： Kyung-Mok LEE ,  HOJIN KANG ,  MINSUNG KWON ,  Dong-Youb LEE ,  Suk-Ho LEE ,  HIROTSUGU KISHIMOTO

IPC: G06F1/16 ,  H01L51/52 ,  G09G3/3225

Abstract: A display device includes a folding area at which the display device is foldable; a first non-folding area and a second non-folding area opposing each other with the folding area therebetween; a display panel; an adhesive member having a thickness of about 15 micrometers to about 18 micrometers; and a protective film facing the display panel with the adhesive member having the thickness of about 15 micrometers to about 18 micrometers therebetween, the adhesive member coupling the protective film to the display panel.

公开(公告)号：US20140353523A1

公开(公告)日：2014-12-04

申请号：US14094051

申请日：2013-12-02

Applicant: Samsung Display Co., Ltd.

Inventor： Alexander VORONOV ,  Suk-Ho LEE ,  Jae-Seung YOO ,  Kyung-Hoe HEO ,  Gyoo-Wan HAN

IPC: G01N21/64 ,  G01N21/95

CPC classification number: G01N21/6489 ,  G01N21/9501

Abstract: A method for inspecting a polysilicon layer includes: radiating excitation light to the polysilicon layer; and detecting a photoluminescence signal generated by the excitation light, wherein average power of the excitation light has a range of 1 W/cm2 to 10 W/cm2, and peak power of the excitation light has a range of 100 W/cm2 to 1000 W/cm2.

Abstract translation: 一种用于检查多晶硅层的方法包括：向多晶硅层辐射激发光; 并且检测由激发光产生的光致发光信号，其中激发光的平均功率具有1W / cm 2至10W / cm 2的范围，并且激发光的峰值功率具有100W / cm 2至1000W的范围 / cm2。