公开(公告)号：US20180122327A1

公开(公告)日：2018-05-03

申请号：US15796133

申请日：2017-10-27

Applicant: Samsung Display Co., Ltd.

Inventor： Jung-taek KIM ,  Sangwoo CHOI

IPC: G09G3/36

CPC classification number: G09G3/3696 ,  G09G3/3648 ,  G09G3/3674 ,  G09G3/3685 ,  G09G3/3688 ,  G09G2310/0289 ,  G09G2310/08 ,  G09G2320/0252 ,  G09G2320/0673 ,  G09G2330/02 ,  G09G2340/0435 ,  G09G2360/02 ,  G09G2370/08

Abstract: A display device includes a display panel including a gate driving circuit which drives gate lines, a data driving circuit which drives data lines based on an image data signal and a driving reference voltage, and a driving controller which controls the gate driving circuit in response to an image signal and a control signal and provides the image data signal and the driving reference voltage to the data driving circuit. The driving controller generates a data enable signal having a display section and a blank section in one frame based on the control signal, and when a difference between a time length of the blank section of a current frame and a time length of the blank section of a previous frame is greater than a reference value, changes the driving reference voltage to a voltage level corresponding to a current frame frequency.

公开(公告)号：US20200074901A1

公开(公告)日：2020-03-05

申请号：US16512990

申请日：2019-07-16

Applicant: Samsung Display Co., Ltd. ,  Korea Advanced Institute of Science and Technology

Inventor： Hoon SOHN ,  Sangwoo CHOI ,  Minsang KOO ,  Sanghyuk KWON ,  Eunchul SHIN ,  Woojin JUNG ,  Jiho PARK ,  Soonkyu HWANG

IPC: G09G3/00 ,  G01N21/956 ,  G01N21/17 ,  G01N25/72

Abstract: An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.