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公开(公告)号：US11205768B2
公开(公告)日：2021-12-21
申请号：US16823934
申请日：2020-03-19
Applicant: Samsung Display Co., Ltd.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
IPC: H01L51/56 , H01L51/00 , H01L23/544 , H01L27/32 , H01L51/52 , H01L21/67 , H01L21/66 , H01L21/78 , G09G3/00
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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Patent Agency Ranking
公开(公告)号：US20220115630A1
公开(公告)日：2022-04-14
申请号：US17555181
申请日：2021-12-17
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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3.发明授权公开(公告)号：US12022722B2
公开(公告)日：2024-06-25
申请号：US17555181
申请日：2021-12-17
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
IPC: H10K71/00 , G09G3/00 , H01L21/66 , H01L21/67 , H01L21/78 , H01L23/544 , H10K50/84 , H10K50/844 , H10K59/12 , H10K59/131 , H10K71/70 , H10K102/00
CPC classification number: H10K71/00 , H01L21/67092 , H01L21/67259 , H01L23/544 , H10K50/844 , H10K59/131 , H10K71/70 , G09G3/006 , H01L22/12 , H01L2223/54426 , H01L2223/5448 , H10K59/1201 , H10K71/851 , H10K2102/351
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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公开(公告)号：US20200220117A1
公开(公告)日：2020-07-09
申请号：US16823934
申请日：2020-03-19
Applicant: Samsung Display Co., Ltd.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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公开(公告)号：US10608209B2
公开(公告)日：2020-03-31
申请号：US15973302
申请日：2018-05-07
Applicant: Samsung Display Co., Ltd.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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公开(公告)号：US20190088909A1
公开(公告)日：2019-03-21
申请号：US15973302
申请日：2018-05-07
Applicant: Samsung Display Co., Ltd.
Inventor： Beomjun Cheon , Kyungsik Kim , Yun-seok Eo , Sang-geun Lee , Seungkuk Lee , Sehee Lim , Jinsoo Choi
Abstract: A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.
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