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公开(公告)号:US12046167B2
公开(公告)日:2024-07-23
申请号:US16512990
申请日:2019-07-16
Inventor: Hoon Sohn , Sangwoo Choi , Minsang Koo , Sanghyuk Kwon , Eunchul Shin , Woojin Jung , Jiho Park , Soonkyu Hwang
IPC: G01N25/72 , G01N21/17 , G01N21/95 , G01N21/956 , G09G3/00
CPC classification number: G09G3/006 , G01N21/171 , G01N21/95607 , G01N25/72 , G01N2021/95615
Abstract: An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.
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公开(公告)号:US11409395B2
公开(公告)日:2022-08-09
申请号:US16667335
申请日:2019-10-29
Applicant: Samsung Display Co., Ltd.
Inventor: Il Ho Lee , Sanghyuk Kwon , Yeongbin Kim , Chansik Noh , Eunchul Shin , Sangmin Choi
Abstract: A testing device for testing a display module may include touch test pads electrically connected to touch pads of a display module, a first power test pad and a second power test pad electrically connected to a first power pad and a second power pad of the display module, a voltage generator providing a first test power voltage and a second power test voltage to the first power test pad and second power test pad, and a capacitance measurement circuit measuring capacitance between the first power test pad and second power test pad.
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