公开(公告)号：US11854445B2

公开(公告)日：2023-12-26

申请号：US17166445

申请日：2021-02-03

Applicant: Samsung Display Co., LTD.

Inventor： Hyung Jin Lee ,  Sang Heon Ye ,  Se Yoon Oh

IPC: G09G3/00 ,  H01L51/56 ,  G01N21/956 ,  G01N21/88 ,  H10K71/00

CPC classification number: G09G3/006 ,  G01N21/8851 ,  G01N21/95607 ,  H10K71/00

Abstract: A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.

公开(公告)号：US12222294B2

公开(公告)日：2025-02-11

申请号：US17737663

申请日：2022-05-05

Applicant: Samsung Display Co., LTD.

Inventor： Jeong Moon Lee ,  Dae Hong Kim ,  Hyung Jin Lee

IPC: G01N21/88 ,  G01N21/31 ,  G01N21/33 ,  G01N21/35 ,  G01N21/84 ,  G01N21/94 ,  G01N21/95

Abstract: An optical inspection device includes: a barrel; a first light source unit at a first side of the barrel and configured to irradiate light of a first wavelength range through a first light path; a second light source unit at a second side of the barrel, the second side being different from the first side, and configured to irradiate light of a second wavelength range that is different from the first wavelength range through a second light path; and a camera. At least a portion of the first light path is different from the second light path.

公开(公告)号：US11322059B2

公开(公告)日：2022-05-03

申请号：US16568140

申请日：2019-09-11

Applicant: Samsung Display Co., Ltd.

Inventor： Hyun Ae Kim ,  Kyung Min Lee ,  Hyung Jin Lee

IPC: G09G3/00 ,  G06K9/62

Abstract: An aging system according to an embodiment includes an aging pad inspector for inspecting an aging pad of a display device, an aging aligner for aligning the aging pad with a probe, and an aging processor for applying an aging signal to the display device through the aging pad and through the probe.

公开(公告)号：US20190147577A1

公开(公告)日：2019-05-16

申请号：US16136094

申请日：2018-09-19

Applicant: Samsung Display Co., Ltd.

Inventor： Hyung Jin Lee ,  Dae Hong Kim ,  Sung Hoon Yang ,  Se Yoon Oh

IPC: G06T7/00 ,  G01N21/95 ,  G01N21/956

Abstract: In a device for detecting a defect, the device includes: an image pickup unit including pixels, the image pickup unit generating a substrate image by picking up an image of a substrate having patterns formed on a top surface thereof; and a controller for detecting a defect located on the substrate, based on the substrate image, wherein the substrate image includes pattern images corresponding to the patterns, wherein each of the pattern images includes pixel values, wherein the controller detects the defect by comparing weights of pixel values for each of the pattern images.