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公开(公告)号：US20210183532A1
公开(公告)日：2021-06-17
申请号：US17269680
申请日：2019-06-13
申请人： Sumitomo Electric Industries, Ltd. , Sumitomo Wiring Systems, Ltd. , AutoNetworks Technologies, Ltd.
发明人： Kei SAKAMOTO , Akiko INOUE , Tetsuya KUWABARA , Yusuke OSHIMA , Minoru NAKAMOTO , Kazuhiro NANJO , Taichiro NISHIKAWA , Yoshihiro NAKAI , Yasuyuki OTSUKA , Fumitoshi IMASATO , Hiroyuki KOBAYASHI
摘要： A covered electrical wire comprises a conductor and an insulating covering layer provided outside the conductor, the conductor being a stranded wire composed of a plurality of copper alloy wires composed of a copper alloy and twisted together, and having a wire diameter of 0.5 mm or less, the copper alloy containing Fe in an amount of 0.1% by mass or more and 1.6% by mass or less, P in an amount of 0.05% by mass or more and 0.7% by mass or less, and Sn in an amount of 0.05% by mass or more and 0.7% by mass or less, and further including one or more elements selected from Zr, Ti and B in an amount of 1000 ppm by mass or less in total, with a balance being Cu and impurities.
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2.发明申请公开(公告)号：US20200181741A1
公开(公告)日：2020-06-11
申请号：US16346033
申请日：2017-08-28
申请人： Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
摘要： An aluminum alloy wire composed of an aluminum alloy is provided. The aluminum alloy contains at least 0.03 mass % and at most 1.5 mass % of Mg, at least 0.02 mass % and at most 2.0 mass % of Si, and a remainder composed of Al and an inevitable impurity, a mass ratio Mg/Si being not lower than 0.5 and not higher than 3.5. In a transverse section of the aluminum alloy wire, a rectangular surface-layer crystallization measurement region having a short side of 50 μm long and a long side of 75 μm long is taken from a surface-layer region extending by up to 50 μm in a direction of depth from a surface of the aluminum alloy wire, and an average area of crystallized materials present in the surface-layer crystallization measurement region is not smaller than 0.05 μm2 and not greater than 3 μm2.
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公开(公告)号：US20220189652A1
公开(公告)日：2022-06-16
申请号：US17685514
申请日：2022-03-03
申请人： Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
IPC分类号： H01B1/02 , C22C21/08 , C22C21/10 , C22C21/14 , C22C21/16 , C22F1/05 , C22F1/053 , C22F1/057 , H01B5/08 , H01B7/00
摘要： An aluminum alloy contains at least 0.03 mass % and at most 1.5 mass % of Mg, at least 0.02 mass % and at most 2.0 mass % of Si, and a remainder composed of Al and an inevitable impurity, a mass ratio Mg/Si being not lower than 0.5 and not higher than 3.5. In a transverse section of the aluminum alloy wire, a rectangular surface-layer void measurement region having a short side of 30 μm long and a long side of 50 μm long is taken from a surface-layer region extending by up to 30 μm in a direction of depth from a surface of the aluminum alloy wire. A total cross-sectional area of voids present in the surface-layer void measurement region is not greater than 2 μm2.
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4.发明申请公开(公告)号：US20200090828A1
公开(公告)日：2020-03-19
申请号：US16346151
申请日：2017-04-04
申请人： Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
IPC分类号： H01B1/02 , C22C21/08 , C22C21/16 , C22C21/14 , C22C21/10 , C22F1/057 , C22F1/053 , C22F1/05 , H01B5/08 , H01B7/00
摘要： An aluminum alloy contains at least 0.03 mass % and at most 1.5 mass % of Mg, at least 0.02 mass % and at most 2.0 mass % of Si, and a remainder composed of Al and an inevitable impurity, a mass ratio Mg/Si being not lower than 0.5 and not higher than 3.5. In a transverse section of the aluminum alloy wire, a rectangular surface-layer void measurement region having a short side of 30 μm long and a long side of 50 μm long is taken from a surface-layer region extending by up to 30 μm in a direction of depth from a surface of the aluminum alloy wire. A total cross-sectional area of voids present in the surface-layer void measurement region is not greater than 2 μm2.
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公开(公告)号：US20220254539A1
公开(公告)日：2022-08-11
申请号：US17728721
申请日：2022-04-25
申请人： Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
摘要： An aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer void measurement region in a shape of a rectangle having a short side length of 30 μm and a long side length of 50 μm is defined within a surface layer region extending from a surface of the aluminum alloy wire by 30 μm in a depth direction, and a total cross-sectional area of voids in the surface-layer void measurement region is equal to or less than 2 μm2.
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公开(公告)号：US20210134475A1
公开(公告)日：2021-05-06
申请号：US17128712
申请日：2020-12-21
申请人： Sumitomo Electric Industries, Ltd , AutoNetworks Technologies, Ltd , Sumitomo Wiring Systems, Ltd
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
摘要： An aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer void measurement region in a shape of a rectangle having a short side length of 30 μm and a long side length of 50 μm is defined within a surface layer region extending from a surface of the aluminum alloy wire by 30 μm in a depth direction, and a total cross-sectional area of voids in the surface-layer void measurement region is equal to or less than 2 μm2.
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公开(公告)号：US20150225635A1
公开(公告)日：2015-08-13
申请号：US14684206
申请日：2015-04-10
发明人： Isao IWAYAMA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yoshiyuki TAKAKI , Misato KUSAKARI , Toshiya IKEDA
IPC分类号： C09K5/14 , H01L23/373 , B32B15/01
CPC分类号： C09K5/14 , B22D19/14 , B22F2998/00 , B32B15/01 , C22C1/1036 , C22C1/1068 , C22C29/02 , C22C29/065 , C22C32/00 , C22C32/0063 , H01L23/3733 , H01L23/3736 , H01L23/3738 , H01L2924/0002 , Y10T428/12049 , Y10T428/12576 , Y10T428/24355 , Y10T428/24479 , Y10T428/249969 , Y10T428/259 , B22F1/02 , H01L2924/00
摘要： A composite member suitable for a heat radiation member of a semiconductor element and a method of manufacturing the same are provided. This composite member is a composite of magnesium or a magnesium alloy and SiC, and it has porosity lower than 3%. This composite member can be manufactured by forming an oxide film on a surface of raw material SiC, arranging coated SiC having the oxide film formed in a cast, and infiltrating this coated SiC aggregate with a molten metal (magnesium or the magnesium alloy). The porosity of the composite member can be lowered by improving wettability between SiC and the molten metal by forming the oxide film. According to this manufacturing method, a composite member having excellent thermal characteristics such as a coefficient of thermal expansion not lower than 4 ppm/K and not higher than 10 ppm/K and thermal conductivity not lower than 180 W/m·K can be manufactured.
摘要翻译： 提供一种适用于半导体元件的散热构件的复合构件及其制造方法。 该复合构件是镁或镁合金与SiC的复合材料，其孔隙率低于3％。 该复合部件可以通过在原料SiC的表面上形成氧化膜，配置具有形成于铸型中的氧化膜的被覆SiC，并用熔融金属（镁或镁合金）渗透该被覆SiC集合体来制造。 通过形成氧化膜，可以通过改善SiC与熔融金属之间的润湿性来降低复合构件的孔隙率。 根据该制造方法，可以制造具有不低于4ppm / K且不高于10ppm / K的热膨胀系数以及不低于180W / m·K的热导率的热特性优异的复合构件 。
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公开(公告)号：US20220351875A1
公开(公告)日：2022-11-03
申请号：US17269718
申请日：2019-06-13
申请人： Sumitomo Electric Industries, Ltd. , Sumitomo Wiring Systems, Ltd. , AutoNetworks Technologies, Ltd.
发明人： Kei SAKAMOTO , Akiko INOUE , Tetsuya KUWABARA , Yusuke OSHIMA , Minoru NAKAMOTO , Kazuhiro NANJO , Taichiro NISHIKAWA , Yoshihiro NAKAI , Yasuyuki OTSUKA , Fumitoshi IMASATO , Hiroyuki KOBAYASHI
摘要： A covered electrical wire comprises a conductor and an insulating covering layer provided outside the conductor, the conductor being a stranded wire composed of a plurality of copper alloy wires composed of a copper alloy and twisted together, and having a wire diameter of 0.5 mm or less, the copper alloy containing Fe in an amount of 0.1% by mass or more and 1.6% by mass or less, P in an amount of 0.05% by mass or more and 0.7% by mass or less, and one or more elements selected from Ni, Al, Cr and Co in an amount of 0.01% by mass or more and 0.7% by mass or less in total, with a balance being Cu and impurities.
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9.发明申请公开(公告)号：US20200075192A1
公开(公告)日：2020-03-05
申请号：US16677734
申请日：2019-11-08
申请人： Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
摘要： An aluminum alloy wire composed of an aluminum alloy, wherein the aluminum alloy contains more than or equal to 0.03 mass % and less than or equal to 1.5 mass % of Mg, more than or equal to 0.02 mass % and less than or equal to 2.0 mass % of Si, and a remainder of Al and an inevitable impurity, Mg/Si being more than or equal to 0.5 and less than or equal to 3.5 in mass ratio, and the aluminum alloy wire has a dynamic friction coefficient of less than or equal to 0.8.
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10.发明申请公开(公告)号：US20200066420A1
公开(公告)日：2020-02-27
申请号：US16346420
申请日：2017-04-04
申请人： SUMITOMO ELECTRIC INDUSTRIES, LTD. , AUTONETWORKS TECHNOLOGIES, LTD. , SUMITOMO WIRING SYSTEMS, LTD.
发明人： Misato KUSAKARI , Tetsuya KUWABARA , Yoshihiro NAKAI , Taichiro NISHIKAWA , Yasuyuki OTSUKA , Hayato OOI
摘要： An aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer void measurement region in a shape of a rectangle having a short side length of 30 μm and a long side length of 50 μm is defined within a surface layer region extending from a surface of the aluminum alloy wire by 30 μm in a depth direction, and a total cross-sectional area of voids in the surface-layer void measurement region is equal to or less than 2 μm2.
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