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公开(公告)号:US20240011193A1
公开(公告)日:2024-01-11
申请号:US18041554
申请日:2021-08-19
CPC分类号: C30B33/10 , H01L21/02381 , H01L21/0245 , H01L21/02513 , C30B29/08 , C30B33/02 , C30B31/22 , C25F3/12
摘要: There is described a method of manufacturing a substrate for an optoelectronic device. The method has the steps of: supporting a first layer of a first crystalline material on a second layer of a second crystalline material different from said first crystalline material thereby exposing crystalline defects at a surface of said first layer; etching said first layer using first etching conditions, at least some of said crystalline defects expanding into pores running from said surface of the first layer towards said second layer; and heating said first and second layers up to a first temperature for a first period of time within a given environment, said heating transforming said pores into nanovoids attracting at least some of said crystalline defects away from said surface. In some embodiments, the method has a step of reheating the layers or a step of forming a pore containing region within the first layer.
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2.
公开(公告)号:US20240093403A1
公开(公告)日:2024-03-21
申请号:US18264975
申请日:2022-02-10
CPC分类号: C30B25/20 , C30B25/10 , C30B25/186 , C30B29/08 , C30B33/02
摘要: There is described a method of manufacturing an optoelectronic device. The method generally has: etching a wafer of monocrystalline germanium, said etching forming a given density of pores contained within said monocrystalline germanium, with at least some of said pores being exposed at a surface of said wafer; depositing a substrate layer of a given crystalline material onto said surface, said substrate layer closing exposed ones of said pores; heating said wafer and said substrate layer, said heating transforming said pores into cavity-interspersed pillars interconnected to one another within said wafer; making a semiconductor component integral to said substrate layer, including collectively forming said optoelectronic device; and breaking said cavity-interspersed pillars of said wafer thereby freeing said optoelectronic device from a remaining wafer portion of said wafer.
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