Detection of fields
    1.
    发明授权

    公开(公告)号:US11353523B2

    公开(公告)日:2022-06-07

    申请号:US16755067

    申请日:2018-10-10

    Applicant: SINTEF TTO AS

    Abstract: A field detector (2) comprises a field-responsive element (10) which undergoes a dimensional change when exposed to a predetermined field; and an interferometric read-out arrangement arranged to detect the dimensional change of the field-responsive element. A light source (4) is arranged to provide a measurement beam reflected from the field-responsive element (10) and a reference beam not reflected from the field-responsive element (10), an optical detector (6) being disposed so as to detect at least part of an interference pattern produced by the measurement beam and the reference beam. The field-responsive element (10) has a shape comprising a curved surface and is constrained at least one edge (12) thereof such that the dimensional change causes the curved surface to be displaced in a direction which changes an optical path length of the measurement beam relative to the reference beam, thereby changing the interference pattern detected by said optical detector.

    DETECTION OF FIELDS
    3.
    发明申请

    公开(公告)号:US20210190884A1

    公开(公告)日:2021-06-24

    申请号:US16755067

    申请日:2018-10-10

    Applicant: SINTEF TTO AS

    Abstract: A field detector (2) comprises a field-responsive element (10) which undergoes a dimensional change when exposed to a predetermined field; and an interferometric read-out arrangement arranged to detect the dimensional change of the field-responsive element. A light source (4) is arranged to provide a measurement beam reflected from the field-responsive element (10) and a reference beam not reflected from the field-responsive element (10), an optical detector (6) being disposed so as to detect at least part of an interference pattern produced by the measurement beam and the reference beam. The field-responsive element (10) has a shape comprising a curved surface and is constrained at least one edge (12) thereof such that the dimensional change causes the curved surface to be displaced in a direction which changes an optical path length of the measurement beam relative to the reference beam, thereby changing the interference pattern detected by said optical detector.

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