SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SPECTROMETRY AND ELECTRONIC APPARATUS

    公开(公告)号:US20190172694A1

    公开(公告)日:2019-06-06

    申请号:US16095747

    申请日:2017-06-12

    IPC分类号: H01J49/00 H01J49/40

    CPC分类号: H01J49/0036 H01J49/40

    摘要: The invention provides signal processing method and system and an electronic apparatus for analysis of time-of-flight mass spectra. The method includes digitalizing an analog signal output from an ion detector to acquire complete raw time-of-flight spectra or each effective part in the raw time-of-flight spectra for a plurality of times; if the complete raw time-of-flight spectra are acquired, extracting the effective parts of each raw time-of-flight spectrum; applying a one-dimensional wavelet transform to each effective part to map to each frequency band or scale; determining positions and intensities of each spectral peak in each raw time-of-flight spectrum by detecting the maxima of an obtained wavelet coefficient distribution, and saving said peak position and intensity as characteristic data of each spectral peak; accumulating the characteristic data obtained by processing each raw time-of-flight spectrum and stacking the data to form spectral peak intensity/time-of-flight histogram.

    IONIZATION AND ION INTRODUCTION DEVICE FOR MASS SPECTROMETER

    公开(公告)号:US20180166268A1

    公开(公告)日:2018-06-14

    申请号:US15580230

    申请日:2016-07-21

    摘要: The disclosure relates to an ionization and ion introduction device for a mass spectrometer. The device includes an ionization source chamber at a pressure below atmospheric pressure; at least one ionization source, which is arranged in the ionization source chamber; at least one ion focusing guide chamber, which is arranged to guide ions into a mass analysis device chamber connected therewith; at least one transfer chamber at pressure below atmospheric pressure, which is located between the ionization source chamber and the ion focusing guide chamber, comprising an inlet interconnected to the ionization source chamber and an outlet interconnected to the ion focusing guide chamber, wherein the air pressure of the transfer chamber is lower than that of the ionization source chamber but higher than that of the ion focusing guide chamber.

    FOCUSING ION GUIDING APPARATUS AND MASS SPECTROGRAPHIC ANALYSIS APPARATUS

    公开(公告)号:US20170256387A1

    公开(公告)日:2017-09-07

    申请号:US15511561

    申请日:2015-11-19

    IPC分类号: H01J49/06 H01J49/36

    摘要: A focusing ion guiding apparatus includes at least one ion guiding inlet and ion guiding outlet connected to each other via a transport axial line; at least one group of focusing electrode structures comprising at least one smooth and non-concave focusing electrode or focusing electrode array to which a focusing voltage is applied, the focusing electrode structure causing the ions transported in the apparatus to be radially focused for many times under the action of a focusing electric field formed by the focusing electrode structure; and a neutral gas flow transported in the axial direction, a diffusion path of the gas flow in an at least partially radial direction relative to the axial direction being blocked by the focusing electrode or its bearing substrate to increase a transport velocity of the gas flow in the axial direction and reduce retention or turbulence of the transported ions.