公开(公告)号：US09476896B2

公开(公告)日：2016-10-25

申请号：US14528118

申请日：2014-10-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jin Soo Park ,  Soo Hong Kim

IPC: G01N1/00 ,  G01N35/10 ,  G01N35/00 ,  B01L3/00 ,  B01L9/00

CPC classification number: G01N35/10 ,  B01L3/50273 ,  B01L9/527 ,  B01L2300/0816 ,  B01L2400/0481 ,  G01N35/00029 ,  G01N2035/00128 ,  G01N2035/1027

Abstract: Disclosed are a sample inspection apparatus and a control method thereof. The sample inspection apparatus includes a housing, a cartridge insertable into one side of the housing and configured to receive a sample, a pressing member disposed within the housing and configured to press the cartridge to inspect the sample, a fluid storage part configured to transfer a fluid to the pressing member so that the pressing member presses the cartridge, and a fluid supply part configured to supply the fluid into the fluid storage part.

Abstract translation: 公开了一种样本检查装置及其控制方法。 样品检查装置包括壳体，可插入到壳体的一侧并被构造成接收样品的盒，设置在壳体内并构造成按压盒以检查样品的按压构件，被配置为传送 流体到按压构件，使得按压构件按压盒;以及流体供给部，其构造成将流体供应到流体容纳部。