公开(公告)号：US11270003B2

公开(公告)日：2022-03-08

申请号：US16858963

申请日：2020-04-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kitak Kim ,  Kiseok Bae ,  Jinsu Hyun

IPC: G06F21/57 ,  G06F8/65 ,  G06F9/445 ,  H04L9/08

Abstract: A method for patching a patchable function programmed in a read only memory (ROM) of a semiconductor device by using firmware loaded onto a first memory includes receiving an encrypted and digitally signed firmware image; generating a verification result by verifying the firmware image by using a public key; decrypting the firmware image by using a secret key depending on the verification result; loading firmware decrypted from the firmware image onto the first memory; and running a replacement function corresponding to an identifier of the patchable function included in the firmware, when the patchable function is called.

公开(公告)号：US11070380B2

公开(公告)日：2021-07-20

申请号：US15212343

申请日：2016-07-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kitak Kim ,  Ji-Su Kang ,  Kiseok Bae ,  Jonghoon Shin ,  Kyoungmoon Ahn ,  Jinsu Hyun

IPC: H04L29/06 ,  H04L9/32 ,  H04L9/30 ,  H04L9/06 ,  H04L9/14 ,  H04W12/069

Abstract: An authentication apparatus, included in a device supporting a network communication, includes a certificate handler that receives a certificate of an opponent and parses or verifies the certificate of the opponent. Cryptographic primitives receive an authentication request of the opponent, generate a random number in response to the authentication request, generate a challenge corresponding to the random number, and verify a response of the opponent corresponding to the challenge. A shared memory stores the parsed certificate, the random number, the challenge, and the response. An authentication controller controls the certificate handler, the cryptographic primitives, and the shared memory through a register setting, according to an authentication protocol.

公开(公告)号：US10146507B2

公开(公告)日：2018-12-04

申请号：US15404826

申请日：2017-01-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Karpinskyy Bohdan ,  Yong-ki Lee ,  Mi-jung Noh ,  Sang-wook Park ,  Kitak Kim ,  Yong-Soo Kim ,  Yun-hyeok Choi

IPC: G06F7/58

Abstract: An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.