公开(公告)号：US12141478B2

公开(公告)日：2024-11-12

申请号：US17932734

申请日：2022-09-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Deokho Seo ,  Taekyeong Ko ,  Namhyung Kim ,  Daejeong Kim ,  Dohan Kim ,  Hoyoung Lee ,  Insu Choi

IPC: G06F3/06 ,  H03M13/00 ,  H03M13/11

Abstract: A memory device includes a memory cell array including a normal region in which first data is stored and a parity region in which a parity bit for the data is stored, and an error correction code (ECC) engine. The ECC engine is configured to determine whether there is an error in the first data based on the first data and the parity bit, and to output, in response to receiving an uncorrected read command from a memory controller, second data in a state in which an error bit in the first data is not corrected.

公开(公告)号：US11721408B2

公开(公告)日：2023-08-08

申请号：US17388238

申请日：2021-07-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Daejeong Kim ,  Namhyung Kim ,  Dohan Kim ,  Deokho Seo ,  Wonjae Shin ,  Insu Choi

IPC: G01R31/28 ,  G11C29/42 ,  G11C29/50 ,  G06F11/10

CPC classification number: G11C29/42 ,  G06F11/1068 ,  G11C29/50004 ,  G11C2029/5004

Abstract: A memory device includes a memory cell array and a test controller. The memory cell array includes a plurality of memory cells, where the memory cell array is divided into multiple regions. The test controller is configured to perform a parallel bit test (PBT) on the plurality of memory cells, where the test controller selects fail data including a fail data bit among internal data output from the multiple regions during the PBT, and outputs the fail data via a data input/output signal line to the outside of the memory device.

公开(公告)号：US11610624B2

公开(公告)日：2023-03-21

申请号：US17474666

申请日：2021-09-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minsu Kim ,  Namhyung Kim ,  Daejeong Kim ,  Dohan Kim ,  Chanik Park ,  Deokho Seo ,  Wonjae Shin ,  Changmin Lee ,  Ilguy Jung ,  Insu Choi

IPC: G11C11/406

Abstract: Provided are a memory device skipping a refresh operation and an operating method thereof. The memory device includes a memory cell array including N rows; a refresh controller configured to control a refresh operation for the N rows of the memory cell array based on a refresh command; and an access information storage circuit including a plurality of registers configured to store flag information corresponding to each of the N rows, wherein a first value indicates rows that have been accessed, and a second value indicates rows that have not been accessed. The refresh controller is further configured to control whether the refresh operation is performed for a first row of the N rows at a refresh timing for the first row based on the flag information corresponding to the first row.

公开(公告)号：US20220215871A1

公开(公告)日：2022-07-07

申请号：US17406511

申请日：2021-08-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minsu Kim ,  Namhyung Kim ,  Daejeong Kim ,  Dohan Kim ,  Chanik Park ,  Deokho Seo ,  Wonjae Shin ,  Changmin Lee ,  Ilguy Jung ,  Insu Choi

IPC: G11C11/406 ,  G11C11/4076 ,  G11C11/4096

Abstract: Provided are an accelerator controlling a memory device, a computing system including the accelerator, and an operating method of the accelerator. The accelerator includes: a signal control/monitoring circuit configured to detect an entry to a self-refresh mode of a memory device and an exit from the self-refresh mode based on monitoring a signal provided from a host; an accelerator logic configured to generate a first command/address signal and a first piece of data; and a selector configured to output the first command/address signal and the first piece of data to the memory device based on detection of the entry to the self-refresh mode, and output a second command/address signal and a second piece of data provided from the host, to the memory device, based on detection of the exit from the self-refresh mode.

公开(公告)号：US11670355B2

公开(公告)日：2023-06-06

申请号：US17406511

申请日：2021-08-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minsu Kim ,  Namhyung Kim ,  Daejeong Kim ,  Dohan Kim ,  Chanik Park ,  Deokho Seo ,  Wonjae Shin ,  Changmin Lee ,  Ilguy Jung ,  Insu Choi

IPC: G11C7/00 ,  G11C11/406 ,  G11C11/4076 ,  G11C11/4096

CPC classification number: G11C11/40615 ,  G11C11/4076 ,  G11C11/4096 ,  G11C11/40618

Abstract: Provided are an accelerator controlling a memory device, a computing system including the accelerator, and an operating method of the accelerator. The accelerator includes: a signal control/monitoring circuit configured to detect an entry to a self-refresh mode of a memory device and an exit from the self-refresh mode based on monitoring a signal provided from a host; an accelerator logic configured to generate a first command/address signal and a first piece of data; and a selector configured to output the first command/address signal and the first piece of data to the memory device based on detection of the entry to the self-refresh mode, and output a second command/address signal and a second piece of data provided from the host, to the memory device, based on detection of the exit from the self-refresh mode.