公开(公告)号：US20180129110A1

公开(公告)日：2018-05-10

申请号：US15805957

申请日：2017-11-07

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： SEONGYEOL SYN ,  JIHEE YOON ,  YONGHEE LEE ,  BEOMJUN KIM ,  JONGHWAN LEE

IPC: G02F1/1362 ,  G02F1/1343

CPC classification number: G02F1/136286 ,  G02F1/134309 ,  G02F1/13439 ,  G02F1/136209 ,  G02F1/136213 ,  G02F1/136227 ,  G02F1/13624 ,  G02F2001/134345 ,  G02F2001/13606 ,  G02F2001/136222 ,  G02F2001/13629 ,  G02F2001/136295 ,  G02F2201/123

Abstract: A display device includes a gate line; first and second adjacent data lines intersecting the gate line; a first sub-pixel electrode between the first and second data lines; a second sub-pixel electrode between the first gate line and the first sub-pixel electrode; a first switching element connected to the first gate line, the first data line and the first sub-pixel electrode; a second switching element connected to the first gate line, the first data line and the second sub-pixel electrode; a connection electrode connecting the first sub-pixel electrode and the first switching element; a first dummy electrode between the first data line and the second sub-pixel electrode; and a second dummy electrode extending from the connection electrode and is disposed closer to the first data line than the second data line. End portions of the first and second dummy electrodes face each other.

公开(公告)号：US20240369349A1

公开(公告)日：2024-11-07

申请号：US18417988

申请日：2024-01-19

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： JONGHWAN LEE ,  YONG JUN PARK

IPC: G01B11/06

Abstract: A thickness measuring device includes: a light source circuit including: a light source which irradiates light to a surface of a substrate including a plurality of thin films and a lens which magnifies light emitted from the light source or reflected from the surface of the substrate, a detector circuit including a spectrometer which measures a reflectance for each wavelength of light reflected from the surface of the substrate and passed through the lens to generate reflectance values and which derives reflectance spectrum data for each wavelength from the reflectance values, and a control circuit which converts the reflectance spectrum data for each wavelength into a digital signal and calculates a thickness of at least one thin film among the plurality of thin films by performing fast Fourier transform on the digital signal.

公开(公告)号：US20200257160A1

公开(公告)日：2020-08-13

申请号：US16864908

申请日：2020-05-01

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： BORAM LEE ,  JISEONG YANG ,  TAEHWAN KIM ,  JONGHWAN LEE ,  SEOKJOON HONG

IPC: G02F1/1333 ,  G02F1/1339 ,  G02F1/1337

Abstract: A liquid crystal display device includes a thin film transistor (TFT) disposed on a substrate. The TFT is divided into pixel regions. Pixel electrodes are disposed in the pixel regions, respectively. The pixel electrodes are electrically connected with the TFT. A roof layer is disposed over the pixel electrodes. Fine spaces, which are spaced apart from each other, are each disposed between each of the pixel electrodes and the roof layer. The fine spaces include a first region and a second region that is below the first region. The second region includes a protrusion protruding in a direction substantially parallel to the substrate with respect to the first region. An alignment layer is disposed on an inner surface of each of the fine spaces. Liquid crystal molecules fill each of the fine spaces.