公开(公告)号：US11911768B2

公开(公告)日：2024-02-27

申请号：US16380195

申请日：2019-04-10

申请人： Roche Diagnostics Operations, Inc.

发明人： Reiner Stein ,  Martin Mertens ,  Werner Heidt

IPC分类号： B01L7/04 ,  B01L9/00 ,  G01N21/84 ,  G01N27/327 ,  G01N33/487 ,  G01N33/49 ,  H05K1/02 ,  H05K1/14 ,  H05K3/36

CPC分类号： B01L7/04 ,  B01L9/52 ,  G01N21/84 ,  G01N27/3271 ,  G01N33/48707 ,  G01N33/4905 ,  H05K1/0212 ,  H05K1/144 ,  H05K3/368 ,  B01L2300/0609 ,  B01L2300/0663 ,  B01L2300/08 ,  B01L2300/1805 ,  B01L2300/1883 ,  H05K2201/041 ,  H05K2201/062 ,  H05K2201/09063 ,  H05K2201/10151 ,  H05K2203/1115

摘要： A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.

公开(公告)号：US10328429B2

公开(公告)日：2019-06-25

申请号：US15723252

申请日：2017-10-03

申请人： Roche Diagnostics Operations, Inc.

发明人： Reiner Stein ,  Lars Fischheiter ,  Martin Mertens

IPC分类号： B01L3/00 ,  G01N33/483 ,  B01L9/00 ,  G01N27/327 ,  G01N27/416 ,  G01N33/487 ,  G01N21/78

摘要： A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.

公开(公告)号：US20180104683A1

公开(公告)日：2018-04-19

申请号：US15723252

申请日：2017-10-03

申请人： Roche Diagnostics Operations, Inc.

发明人： Reiner Stein ,  Lars Fischheiter ,  Martin Mertens

IPC分类号： B01L3/00 ,  B01L9/00

CPC分类号： B01L3/508 ,  B01L9/00 ,  B01L2200/025 ,  B01L2200/14 ,  B01L2300/0627 ,  G01N21/78 ,  G01N27/3273 ,  G01N27/416 ,  G01N33/4875

摘要： A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.

公开(公告)号：US20190232292A1

公开(公告)日：2019-08-01

申请号：US16380195

申请日：2019-04-10

申请人： Roche Diagnostics Operations, Inc.

发明人： Reiner Stein ,  Martin Mertens ,  Werner Heidt

IPC分类号： B01L7/04 ,  H05K1/02 ,  H05K3/36 ,  H05K1/14 ,  B01L9/00 ,  G01N33/49

CPC分类号： B01L7/04 ,  B01L9/52 ,  B01L2300/0609 ,  B01L2300/0663 ,  B01L2300/08 ,  B01L2300/1805 ,  B01L2300/1883 ,  G01N21/84 ,  G01N27/3271 ,  G01N33/48707 ,  G01N33/4905 ,  H05K1/0212 ,  H05K1/144 ,  H05K3/368 ,  H05K2201/041 ,  H05K2201/062 ,  H05K2201/09063 ,  H05K2201/10151 ,  H05K2203/1115

摘要： A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.