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公开(公告)号:US20190232292A1
公开(公告)日:2019-08-01
申请号:US16380195
申请日:2019-04-10
发明人: Reiner Stein , Martin Mertens , Werner Heidt
CPC分类号: B01L7/04 , B01L9/52 , B01L2300/0609 , B01L2300/0663 , B01L2300/08 , B01L2300/1805 , B01L2300/1883 , G01N21/84 , G01N27/3271 , G01N33/48707 , G01N33/4905 , H05K1/0212 , H05K1/144 , H05K3/368 , H05K2201/041 , H05K2201/062 , H05K2201/09063 , H05K2201/10151 , H05K2203/1115
摘要: A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.
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公开(公告)号:US11911768B2
公开(公告)日:2024-02-27
申请号:US16380195
申请日:2019-04-10
发明人: Reiner Stein , Martin Mertens , Werner Heidt
IPC分类号: B01L7/04 , B01L9/00 , G01N21/84 , G01N27/327 , G01N33/487 , G01N33/49 , H05K1/02 , H05K1/14 , H05K3/36
CPC分类号: B01L7/04 , B01L9/52 , G01N21/84 , G01N27/3271 , G01N33/48707 , G01N33/4905 , H05K1/0212 , H05K1/144 , H05K3/368 , B01L2300/0609 , B01L2300/0663 , B01L2300/08 , B01L2300/1805 , B01L2300/1883 , H05K2201/041 , H05K2201/062 , H05K2201/09063 , H05K2201/10151 , H05K2203/1115
摘要: A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.
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公开(公告)号:US20190004026A1
公开(公告)日:2019-01-03
申请号:US16106608
申请日:2018-08-21
发明人: Kai Hebestreit , Sylvia Saecker , Klaus Thome , Werner Heidt
IPC分类号: G01N33/487 , G01N27/327 , A61B5/145 , A61B5/1477
摘要: A test element analysis system for an analytical examination of a sample, in particular of a body fluid, is disclosed. The test element analysis system comprises an evaluation device with a test element holder for positioning a test element containing the sample and a measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for an analyte. The test element holder contains contact elements with contact surfaces which allow an electrical contact between contact surfaces of the test element and the contact surfaces of the test element holder. The contact surfaces of the contact elements of the test element holder are provided with an electrically conductive surface containing metallic ruthenium.
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公开(公告)号:US11041846B2
公开(公告)日:2021-06-22
申请号:US16106889
申请日:2018-08-21
发明人: Kai Hebestreit , Sylvia Saecker , Klaus Thome , Andreas Weller , Robert Knapstein , Werner Heidt , Stefan Lieder
IPC分类号: G01N25/00 , G01K1/00 , G01K7/00 , G01N33/487 , G01N27/327 , A61B5/145 , G01N33/49
摘要: A test element analysis system for the analytical examination of a sample is disclosed. The test element analysis system comprises: at least one evaluation device with at least one test element holder for positioning a test element containing the sample and at least one measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for the analyte; at least one electrical heating element configured for electrically heating the test element; at least one electrical power supply for supplying electrical energy to the electrical heating element; at least one temperature sensor connected to the test element holder for detecting a temperature of the test element holder; at least one gap detection device configured for monitoring the electrical energy Espez supplied by the electrical power supply to the electrical heating element for reaching a predetermined target temperature measured by the temperature sensor.
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公开(公告)号:US11002726B2
公开(公告)日:2021-05-11
申请号:US16106608
申请日:2018-08-21
发明人: Kai Hebestreit , Sylvia Saecker , Klaus Thome , Werner Heidt
IPC分类号: G01N33/487 , A61B5/145 , G01N27/327 , A61B5/1477
摘要: A test element analysis system for an analytical examination of a sample, in particular of a body fluid, is disclosed. The test element analysis system comprises an evaluation device with a test element holder for positioning a test element containing the sample and a measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for an analyte. The test element holder contains contact elements with contact surfaces which allow an electrical contact between contact surfaces of the test element and the contact surfaces of the test element holder. The contact surfaces of the contact elements of the test element holder are provided with an electrically conductive surface containing metallic ruthenium.
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公开(公告)号:US20180356391A1
公开(公告)日:2018-12-13
申请号:US16106889
申请日:2018-08-21
发明人: Kai Hebestreit , Sylvia Saecker , Klaus Thome , Andreas Weller , Robert Knapstein , Werner Heidt , Stefan Lieder
IPC分类号: G01N33/487 , G01N25/00
CPC分类号: G01N33/48785 , A61B5/145 , A61B5/14532 , G01N25/00 , G01N27/3273 , G01N33/4905
摘要: A test element analysis system for the analytical examination of a sample is disclosed. The test element analysis system comprises: at least one evaluation device with at least one test element holder for positioning a test element containing the sample and at least one measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for the analyte; at least one electrical heating element configured for electrically heating the test element; at least one electrical power supply for supplying electrical energy to the electrical heating element; at least one temperature sensor connected to the test element holder for detecting a temperature of the test element holder; at least one gap detection device configured for monitoring the electrical energy Espez supplied by the electrical power supply to the electrical heating element for reaching a predetermined target temperature measured by the temperature sensor.
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