公开(公告)号：US20250094264A1

公开(公告)日：2025-03-20

申请号：US18470333

申请日：2023-09-19

Applicant: QUALCOMM Incorporated

Inventor： Mohsin RIAZ ,  Tamer KAFAFI ,  Xavier Loic LELOUP ,  Mosaddiq SAIFUDDIN

IPC: G06F11/07 ,  G06F9/30

Abstract: Various embodiments include methods and devices for implementing a scan dump of memory subsystem cores. Embodiments may include enabling a scan dump path of the memory subsystem during a computing device crash reset flow, the scan dump path comprising at least one memory controller having at least one scan dump logic module, a scan dump network on chip (NoC) module, and at least one scan dump data bus connecting the at least one scan dump logic module and the scan dump NoC, and initializing a scan mode for a memory path of the memory subsystem and for a low power memory path of the memory subsystem.