公开(公告)号：US20180137929A1

公开(公告)日：2018-05-17

申请号：US15350669

申请日：2016-11-14

Applicant: QUALCOMM Incorporated

Inventor： Giby Samson ,  Erik Hedberg ,  Francois Atallah ,  Keith Bowman

IPC: G11C29/50 ,  G11C11/419

CPC classification number: G11C29/50012 ,  G11C5/147 ,  G11C11/419 ,  G11C29/021 ,  G11C29/028

Abstract: A device includes a first set of storage elements, a second set of storage elements, and a bias circuit configured to generate a test bias signal to bias the first set of storage elements and the second set of storage elements. The device further includes a sensor circuit configured to receive a first signal from at least a first storage element of the first set of storage elements in response to the test bias signal and to receive a second signal from at least a second storage element of the second set of storage elements in response to the test bias signal. The sensor circuit is further configured to generate a third signal having a delay characteristic indicating a wear difference between the first storage element and the second storage element.