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公开(公告)号：US20210209797A1
公开(公告)日：2021-07-08
申请号：US17142195
申请日：2021-01-05
Applicant: QUALCOMM Incorporated
Inventor： Jeong-Kyun LEE , Young-Ki BAIK , Hankyu CHO , Dongju KIM
Abstract: Techniques and systems are provided for determining features of one or more objects in one or more images. For example, an image of an object and a three-dimensional model associated with the object can be obtained. From the image, a sample point on the object can be determined. A depth and an angle of the sample point of the object can be determined. A pose and a shape of the three-dimensional model associated with the object can be determined based on the depth and the angle.
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