ON-CHIP SENSOR FOR MEASURING DYNAMIC POWER SUPPLY NOISE OF THE SEMICONDUCTOR CHIP
    2.
    发明申请
    ON-CHIP SENSOR FOR MEASURING DYNAMIC POWER SUPPLY NOISE OF THE SEMICONDUCTOR CHIP 审中-公开
    用于测量半导体芯片动态电源噪声的片上传感器

    公开(公告)号:US20130285696A1

    公开(公告)日:2013-10-31

    申请号:US13928424

    申请日:2013-06-27

    CPC classification number: G01R31/31721 G01R29/26

    Abstract: An on-chip sensor measures dynamic power supply noise, such as voltage droop, on a semiconductor chip. In-situ logic is employed, which is sensitive to noise present on the power supply of functional logic of the chip. Exemplary functional logic includes a microprocessor, adder, and/or other functional logic of the chip. The in-situ logic performs some operation, and the amount of time required for performing that operation (i.e., the operational delay) is sensitive to noise present on the power supply. Thus, by evaluating the operational delay of the in-situ logic, the amount of noise present on the power supply can be measured.

    Abstract translation: 片上传感器测量半导体芯片上的动态电源噪声,如电压下降。 采用原位逻辑,对芯片功能逻辑电源上存在的噪声敏感。 示例性功能逻辑包括芯片的微处理器,加法器和/或其他功能逻辑。 原位逻辑执行一些操作,并且执行该操作所需的时间量(即,操作延迟)对电源上存在的噪声敏感。 因此,通过评估原位逻辑的操作延迟,可以测量电源上存在的噪声量。

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