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    Amplifier circuit including first input branch circuit, second input branch circuit, feedback capacitor, and operational amplifier and pulse-wave measuring device
    3.
    发明授权
    Amplifier circuit including first input branch circuit, second input branch circuit, feedback capacitor, and operational amplifier and pulse-wave measuring device 有权

    公开(公告)号：US10340868B2

    公开(公告)日：2019-07-02

    申请号：US15594075

    申请日：2017-05-12

    Applicant: Panasonic Intellectual Property Management Co., Ltd.

    Inventor： Koji Obata ,  Kazuo Matsukawa

    IPC: H03F3/45 ,  A61B5/024 ,  A61B5/00 ,  A61B5/021

    Abstract: An amplifier circuit includes a first input branch circuit including a first sampling capacitor, a second input branch circuit including a second sampling capacitor, an averaging capacitor, and a subtraction capacitor, a feedback capacitor, and an operational amplifier. The first sampling capacitor samples an input voltage in a first time period and outputs a first voltage. The second sampling capacitor samples the input voltage in the first time period and outputs a second voltage. The averaging capacitor takes an average of the second voltage in the second time period and outputs a third voltage. The subtraction capacitor receives the third voltage in the first time period. The subtraction capacitor subtracts the first voltage from the third voltage and outputs a fourth voltage in the second time period. The operational amplifier is connected to the feedback capacitor and amplifies the fourth voltage. The first and second time periods are repeated alternately.

    Analog-to-digital converter, sensor system , and test system
    4.
    发明授权
    Analog-to-digital converter, sensor system , and test system 有权

    公开(公告)号：US11611349B2

    公开(公告)日：2023-03-21

    申请号：US17427060

    申请日：2020-03-13

    Applicant: Panasonic Intellectual Property Management Co., Ltd.

    Inventor： Koji Obata ,  Jun'ichi Naka ,  Junji Nakatsuka ,  Hiroki Yoshino ,  Masaaki Nagai

    IPC: H03M1/10 ,  H03M1/46 ,  H03M3/00 ,  G01R19/25

    Abstract: Provided are an analog-to-digital (AD) converter, a sensor system, and a test system capable of reducing the time for test processing. AD converter includes input part, AD conversion part, first output part, and second output part. The analog signal output from sensor is input to input part. AD conversion part digitally converts an analog signal to generate first digital data and second digital data. First output part outputs the first digital data to control circuit. Second output part outputs the second digital data to test controller before first output part outputs the first digital data. In the test mode, test controller determines whether or not sensor system including sensor is in an abnormal state on the basis of the second digital data.

    A/D converter and sensor system including the same
    5.
    发明授权
    A/D converter and sensor system including the same 有权

    公开(公告)号：US12278647B2

    公开(公告)日：2025-04-15

    申请号：US18245815

    申请日：2021-06-10

    Applicant: Panasonic Intellectual Property Management Co., Ltd.

    Inventor： Jun'ichi Naka ,  Koji Obata

    IPC: H03M1/12 ,  H03M1/46 ,  G01P1/00

    Abstract: A D/A converting unit generates a comparative voltage corresponding to a target bit falling within a range from a most significant bit through a least significant bit. A comparator determines a value of the target bit by comparing a differential voltage between an output signal of an input switching unit and a comparative voltage generated by the D/A converting unit with a reference voltage. An integrator integrates a conversion error. In a first conversion operation of converting a first signal, a control unit sets, based on a result obtained by the integrator, the reference voltage for use when the first signal to be provided next time as the output signal by the input switching unit is A/D converted. In a second conversion operation of A/D converting a second signal, the control unit sets the reference voltage at a constant voltage level.

    A/D converter
    6.
    发明授权
    A/D converter 有权

    公开(公告)号：US12206430B2

    公开(公告)日：2025-01-21

    申请号：US18022071

    申请日：2021-06-15

    Applicant: Panasonic Intellectual Property Management Co., Ltd.

    Inventor： Koji Obata

    IPC: H03M1/46

    Abstract: A comparator compares a differential voltage between a voltage to be converted as an analog input voltage and a comparative voltage generated by a D/A converting unit with a comparison reference voltage. A switching circuit selectively connects a capacitor, associated with the analog input voltage selected as the voltage to be converted, to an output terminal of an integrator. The integrator integrates the differential voltage in a state where an A/D converting section has performed conversion operation on a least significant bit. A comparison reference voltage generating unit uses, as the comparison reference voltage, a charge voltage for the capacitor associated with the analog input voltage selected as the voltage to be converted.

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