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公开(公告)号:US10049933B2
公开(公告)日:2018-08-14
申请号:US15594690
申请日:2017-05-15
Inventor: Atsushi Harikai , Shogo Okita , Akihiro Itou , Katsumi Takano , Mitsuru Hiroshima
IPC: H01L21/78 , H01L21/3065 , H01L21/683 , H01L23/00 , H01L21/302 , H01L21/304
Abstract: An element chip manufacturing method includes a preparation process of preparing a substrate which includes a first surface provided with a bump and a second surface and includes a plurality of element regions defined by dividing regions, a bump embedding process of adhering a protection tape having an adhesive layer to the first surface and embedding. The element chip manufacturing method includes a thinning process of grinding the second surface in a state where the protection tape is adhered to the first surface and thinning the substrate, after the bump embedding process, a mask forming process of forming a mask in the second surface and exposes the dividing regions, after the thinning process, a holding process of arranging the first surface to oppose a holding tape supported on a frame and holding the substrate on the holding tape.
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公开(公告)号:US10236266B2
公开(公告)日:2019-03-19
申请号:US15594696
申请日:2017-05-15
Inventor: Atsushi Harikai , Shogo Okita , Akihiro Itou , Katsumi Takano , Mitsuru Hiroshima
IPC: H01L21/48 , H01L21/67 , H01L21/687 , H01L23/498 , H05K13/04 , H01L23/00 , B44C1/22
Abstract: An element chip manufacturing method includes a preparation process of preparing a substrate which includes a first surface having an exposed bump and a second surface opposite to the first surface and includes a plurality of element regions defined by dividing regions, a bump embedding process of embedding at least a head top part of the bump into the adhesive layer, a mask forming process of forming a mask in the second surface. The method for manufacturing the element chip includes a holding process of arranging the first surface to oppose a holding tape supported on a frame and holding the substrate on the holding tape, a placement process of placing the substrate on a stage provided inside of a plasma processing apparatus through the holding tape, after the mask forming process and the holding process.
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