Semiconductor device and method of manufacturing thereof

    公开(公告)号:US11358858B2

    公开(公告)日:2022-06-14

    申请号:US16751567

    申请日:2020-01-24

    Abstract: A method of manufacturing a semiconductor device includes providing a semiconductor layer having a first-type region and a second-type region that are stacked and interface with each other to form a p-n junction, the first-type region defining a first side of the semiconductor layer and the second-type region defining a second side of the semiconductor layer. The method further includes providing an insulating layer on the second side of the semiconductor layer and etching the semiconductor layer from the first side of the semiconductor layer toward the second side of the semiconductor layer to form a trench. The first-type region corresponds to one of a n-type region and a p-type region, and the second-type region corresponds to the other of the n-type region and the p-type region.

    Calibration system, and sensor system including the same

    公开(公告)号:US11125579B2

    公开(公告)日:2021-09-21

    申请号:US16369685

    申请日:2019-03-29

    Abstract: An aspect of the present disclosure concerns a calibration system including a test tone signal generator that produces a test tone; a transimpedance amplifier (TIA) that comprises two input terminals, receives two output signals from an external sensor device, the test tone, and a calibration signal at the two input terminals, and produces a voltage signal; and a calibration circuit that receives the voltage signal and the test tone to produce the calibration signal that causes the TIA to produce the voltage signal such that an error signal included in the voltage signal is canceled. The external sensor device may be a mode-matched vibratory micro-electro-mechanical systems (MEMS) gyroscope.

    CALIBRATION SYSTEM, AND SENSOR SYSTEM INCLUDING THE SAME

    公开(公告)号:US20200309563A1

    公开(公告)日:2020-10-01

    申请号:US16369685

    申请日:2019-03-29

    Abstract: An aspect of the present disclosure concerns a calibration system including a test tone signal generator that produces a test tone; a transimpedance amplifier (TIA) that comprises two input terminals, receives two output signals from an external sensor device, the test tone, and a calibration signal at the two input terminals, and produces a voltage signal; and a calibration circuit that receives the voltage signal and the test tone to produce the calibration signal that causes the TIA to produce the voltage signal such that an error signal included in the voltage signal is canceled. The external sensor device may be a mode-matched vibratory micro-electro-mechanical systems (MEMS) gyroscope.

    Sensing device
    6.
    发明授权

    公开(公告)号:US11614328B2

    公开(公告)日:2023-03-28

    申请号:US17420790

    申请日:2019-12-27

    Abstract: A sensing device includes an anchor having a central axis that defines a first radial direction and a second radial direction, and a resonant member flexibly supported by the anchor that includes a main body made of a single-crystal solid. The main body has a first material stiffness in the first radial direction and a second material stiffness in the second radial direction that is less than the first material stiffness. Moreover, the main body has a first component stiffness in the first radial direction and a second component stiffness in the second radial direction that is substantially similar to the first component stiffness. Another sensing device includes a resonant member having a main body that defines an aperture extending through the main body, and an electrode located in the aperture such that a capacitive channel is defined between the electrode and the main body that circumscribes the electrode.

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