专利检索 ap:("PARK SYSTEMS CORP.") AND inv:"JeongHun AN" 第 1 页

1.

发明申请
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORCE MICROSCOPE 有权

公开(公告)号：US20220206039A1

公开(公告)日：2022-06-30

申请号：US17561920

申请日：2021-12-24

申请人： PARK SYSTEMS CORP.

发明人： JeongHun AN , YongSung CHO , Sang-il PARK

IPC分类号： G01Q30/02 , G01Q60/24 , G05B13/02 , G01Q30/20

摘要： An apparatus and a method for identifying a sample position in an atomic force microscope according to an exemplary embodiment of the present disclosure are provided. The method for identifying a sample position in an atomic force microscope includes receiving a vision image including a subject sample through a vision unit; determining a subject sample region in the vision image using a prediction model which is configured to output the subject sample region by receiving the vision image as an input; and determining a position of the subject sample based on the subject sample region.