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公开(公告)号：US11867634B2
公开(公告)日：2024-01-09
申请号：US17127027
申请日：2020-12-18
发明人： Qi Sun , Jian Zheng , Stephen Daggett
CPC分类号： G01N21/77 , G01N33/726 , G01N33/728 , G02B5/0833 , H04N23/56
摘要： The present disclosure is directed to a thin-film element that enables analytes to be analyzed on separate surfaces. In an example, a thin-film element includes a first layer for processing a fluid sample to generate a first analyte and a second analyte. The thin-film element also includes a second layer configured to be impermeable to the first analyte to enable the first analyte to be retained by the first layer and permeable to the second analyte to enable the second analyte to pass through the second layer. The thin-film element further includes a third layer configured to retain the second analyte. The second layer includes a first reflective surface and a second reflective surface to provide reflectance signals indicative of analytes present in the first and third layers to sensors located on opposite sides of the thin-film element.
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公开(公告)号：US20210190696A1
公开(公告)日：2021-06-24
申请号：US17127027
申请日：2020-12-18
发明人： Qi Sun , Jian Zheng , Stephen Daggett
摘要： The present disclosure is directed to a thin-film element that enables analytes to be analyzed on separate surfaces. In an example, a thin-film element includes a first layer for processing a fluid sample to generate a first analyte and a second analyte. The thin-film element also includes a second layer configured to be impermeable to the first analyte to enable the first analyte to be retained by the first layer and permeable to the second analyte to enable the second analyte to pass through the second layer. The thin-film element further includes a third layer configured to retain the second analyte. The second layer includes a first reflective surface and a second reflective surface to provide reflectance signals indicative of analytes present in the first and third layers to sensors located on opposite sides of the thin-film element.
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