MERGED SURFACE FAST SCAN TECHNIQUE FOR GENERATING A REFERENCE EMI FINGERPRINT TO DETECT UNWANTED COMPONENTS IN ELECTRONIC SYSTEMS

    公开(公告)号:US20210081573A1

    公开(公告)日:2021-03-18

    申请号:US16572439

    申请日:2019-09-16

    Abstract: The disclosed embodiments provide a system that generates a reference EMI fingerprint to be used in detecting unwanted electronic components in a target asset. During operation, the system gathers reference EMI signals generated by a reference asset while the reference asset is executing a periodic workload, wherein the reference asset is of the same type as the target asset and is certified not to contain unwanted electronic components. Next, the system divides the reference EMI signals into a set of profiles, which comprise EMI signals for non-overlapping time intervals of a fixed size. The system then temporally aligns and merges profiles in the set of profiles to produce a reference profile. Next, the system generates the reference EMI fingerprint from the reference profile. Finally, the system compares a target EMI fingerprint for the target asset against the reference EMI fingerprint to determine whether the target asset contains unwanted electronic components.

    Detecting counterfeit components in utility system electronics based on EMI fingerprints

    公开(公告)号:US10685226B1

    公开(公告)日:2020-06-16

    申请号:US16292623

    申请日:2019-03-05

    Abstract: The disclosed embodiments provide a system that detects counterfeit electronic components in a target device, which is part of an electrical generation and distribution system. During operation, the system obtains target EMI signals, which were gathered by monitoring target electromagnetic interference (EMI) emissions generated by the target device using one or more target antennas positioned in proximity to the target device. Next, the system generates a target EMI fingerprint for the target device from the target EMI signals. Finally, the system compares the target EMI fingerprint against a reference EMI fingerprint for the target device to determine whether the target device contains one or more counterfeit electronic components.

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