公开(公告)号：US20180073926A1

公开(公告)日：2018-03-15

申请号：US15812049

申请日：2017-11-14

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi KONISHI ,  Takema SATOH ,  Tomotaka NAGASHIMA

IPC: G01J3/457 ,  G01J3/18 ,  G02B6/12 ,  G01J3/02 ,  G01J3/28

CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.

公开(公告)号：US20160033331A1

公开(公告)日：2016-02-04

申请号：US14775321

申请日：2014-03-10

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi KONISHI ,  Takema SATOH ,  Tomotaka NAGASHIMA

IPC: G01J3/457 ,  G01J3/18

CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).

Abstract translation: 测量目标光的波长的光波长测量方法包括：在将目标光分散成多个第二光束的第二色散装置上接收目标光，所述第二光束到达对应于目标光的波长的多个位置（S106， S202）; 并且通过使用多个第二光束作为用于测量由主刻度指定的波长范围内的目标光的波长的游标（S108，S204）来测量目标光的波长。