公开(公告)号：US12072180B2

公开(公告)日：2024-08-27

申请号：US18157345

申请日：2023-01-20

Applicant: OMRON Corporation

Inventor： Shingo Hayashi ,  Beiping Jin

IPC: G01B11/26 ,  G06T7/70 ,  G06T7/80 ,  H04N7/18 ,  H04N17/00

CPC classification number: G01B11/26 ,  G06T7/70 ,  G06T7/80 ,  H04N7/183 ,  H04N17/002 ,  G06T2207/30208 ,  G06T2207/30244

Abstract: Provided are a measurement method, and a measurement device that enable measuring a deviation amount in an arrangement angle of a camera, with respect to a reference direction of a shaft of the camera, and that enable correcting a deviation in the arrangement angle at low cost with high accuracy. The measurement method includes: an imaging step of imaging a target object, provided with a reference mark configured to identify a slope-known straight line, a plurality of times in different visual fields; an image processing step of obtaining the straight line identified based on the reference mark where a plurality of the straight lines corresponds to a plurality of the reference marks in images imaged in the different visual fields, respectively; and a calculating step of calculating a rotation angle, as the deviation amount in the arrangement angle, with which a distance between the straight lines becomes zero.