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公开(公告)号：US20190192090A1
公开(公告)日：2019-06-27
申请号：US16232072
申请日：2018-12-26
发明人： Liang Li , Zhiqiang Chen , Kejun Kang , Ziran Zhao , Li Zhang , Yuxiang Xing , Tiao Zhao , Jianmin Li , Bicheng Liu , Qian Yi
摘要： The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.
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公开(公告)号：US11699223B2
公开(公告)日：2023-07-11
申请号：US15858868
申请日：2017-12-29
发明人： Ziran Zhao , Jianping Gu , Bicheng Liu , Qi Wang , Xi Yi
CPC分类号： G06T7/0004 , G01P13/00 , G01T1/00 , G01V5/0058 , G06F3/016 , G06T7/74 , G06T15/08 , G06Q50/30 , G06T2207/10012 , G06T2207/10081 , G06T2207/30232
摘要： A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.
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公开(公告)号：US11619599B2
公开(公告)日：2023-04-04
申请号：US16935415
申请日：2020-07-22
发明人： Zhi Zeng , Xingyu Pan , Xuewu Wang , Junli Li , Ming Zeng , Jianmin Li , Ziran Zhao , Jianping Cheng , Hao Ma , Hui Zhang , Hao Yu , Bicheng Liu
IPC分类号： G01N23/201 , G01N23/02 , G06K9/62
摘要： The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.
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公开(公告)号：US20180156741A1
公开(公告)日：2018-06-07
申请号：US15716921
申请日：2017-09-27
发明人： Kejun Kang , Jianping Cheng , Zhiqiang Chen , Ziran Zhao , Junli Li , Xuewu Wang , Zhi Zeng , Ming Zeng , Yi Wang , Qingjun Zhang , Jianping Gu , Xi Yi , Bicheng Liu , Guangming Xu , Yongqiang Wang
CPC分类号： G01N23/04 , G01N23/046 , G01N23/06 , G01N23/20008 , G01N2223/304 , G01N2223/33 , G01N2223/401 , G01N2223/419 , G01N2223/652 , G01V5/0016 , G01V5/0025 , G01V5/0091
摘要： Inspection devices and inspection methods are disclosed. The inspection method includes: performing X-ray scanning on an object being inspected so as to generate an image of the object being inspected; dividing the image of the object being inspected to determine at least one region of interest; detecting interaction between a cosmic ray and the region of interest to obtain a detection value; calculating a scattering characteristic value and/or an absorption characteristic value of the cosmic ray in the region of interest based on size information of the region of interest and the detection value; and discriminating a material attribute of the region of interest by means of the scattering characteristic value and/or the absorption characteristic value. With the above technical solutions, inspection accuracy and inspection efficiency may be improved.
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公开(公告)号：US11614413B2
公开(公告)日：2023-03-28
申请号：US17255968
申请日：2020-01-03
发明人： Jianmin Li , Li Zhang , Yuanjing Li , Zhiqiang Chen , Hao Yu , Shangmin Sun , Bicheng Liu , Weizhen Wang , Dongyu Wang , Yuan Ma , Yu Hu , Chunguang Zong
IPC分类号： G01N23/20008 , G01N23/203
摘要： The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
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公开(公告)号：US10448904B2
公开(公告)日：2019-10-22
申请号：US16232072
申请日：2018-12-26
发明人： Liang Li , Zhiqiang Chen , Kejun Kang , Ziran Zhao , Li Zhang , Yuxiang Xing , Tiao Zhao , Jianmin Li , Bicheng Liu , Qian Yi
摘要： The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.
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公开(公告)号：US20180189945A1
公开(公告)日：2018-07-05
申请号：US15858868
申请日：2017-12-29
发明人： Ziran Zhao , Jianping Gu , Bicheng Liu , Qi Wang , Xi Yi
CPC分类号： G06T7/0004 , G01P13/00 , G01T1/00 , G01V5/0058 , G06F3/016 , G06Q50/30 , G06T7/74 , G06T15/08 , G06T2207/10012 , G06T2207/10081 , G06T2207/30232
摘要： A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.
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公开(公告)号：US10101473B2
公开(公告)日：2018-10-16
申请号：US15606071
申请日：2017-05-26
发明人： Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC分类号： G01T1/24 , H01L31/02 , H05K1/18 , H05K1/02 , H05K1/11 , H01L31/119 , H01L31/0296
摘要： The present disclosure provides a semiconductor detector. The semiconductor detector comprises: a detector crystal including a crystal body, an anode and a cathode; a field enhance electrode for applying a voltage to the detector crystal; an insulating material disposed between the field enhanced electrode and a surface of the detector crystal. The semiconductor detector further comprises a field enhanced electrode circuit board having a bottom connection layer in contact with the surface of the detector crystal and a top layer opposite to the bottom connection layer, wherein the top layer is connected to a high voltage input terminal of the semiconductor detector, and an insulating material is provided between the bottom connection layer and the detector surface of the detector crystal.
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公开(公告)号：US11812002B2
公开(公告)日：2023-11-07
申请号：US17382236
申请日：2021-07-21
发明人： Bicheng Liu , Hao Yu , Weizhen Wang , Guangming Xu , Haojie Chi , Shangmin Sun , Chunguang Zong , Yu Hu
CPC分类号： H04N1/4092 , G06T3/4007 , G06T5/006 , G06T5/50 , G06T7/97 , H04N1/00005 , H04N1/00037 , G06T2207/10008 , G06T2207/20021
摘要： The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.
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公开(公告)号：US11055869B2
公开(公告)日：2021-07-06
申请号：US16226645
申请日：2018-12-20
发明人： Bicheng Liu , Haoran Zhang , Guangming Xu , Qi Wang , Qiangqiang Zhu , Yuan Wo
摘要： The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.
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