公开(公告)号：US20170108532A1

公开(公告)日：2017-04-20

申请号：US14884893

申请日：2015-10-16

Applicant: National Central University

Inventor： Szu-Yu CHEN ,  Chia-Hua YEH

IPC: G01Q60/18 ,  G01N21/35

CPC classification number: G01N21/35 ,  A61B18/20 ,  G02B21/0076 ,  G02B21/367

Abstract: An image processing method of two-photon structured illumination point scanning microscopy is disclosed. The image processing method includes the following steps: providing a laser light source; performing scanning and recording; and performing image reconstruction. The laser light source, which has photon energy that is half of the energy needed to let a molecule of a sample make a transition from ground state to a first excited state, is focused onto a focal plane of the sample. Then, the laser light source is accompanied with an image recording system to perform a plurality of segmented scanning and image recordings on the sample to generate a plurality of structured illumination images. Those structured illumination images are reconstructed to generate microscopic image of the sample. With the implementation of the present invention, the interference from image signal on the non-focal plane can be effectively reduced, thereby enhancing the resolution of microscopic image.

公开(公告)号：US20170017068A1

公开(公告)日：2017-01-19

申请号：US14847538

申请日：2015-09-08

Applicant: National Central University

Inventor： Szu-Yu CHEN ,  Jui-Fen CHANG ,  Chao-Yi TAI ,  Hao-Hao WU

IPC: G02B21/00 ,  G02F1/35

CPC classification number: G02B21/0072 ,  G02B21/0032 ,  G02B21/0084 ,  G02B21/16 ,  G02B21/365 ,  G02F1/353

Abstract: The present invention discloses a method for non-fluorescence higher harmonic generation ground state depletion super-resolution microscopy, it includes the following steps: providing an organic material unit, focusing excitation light and ground state depletion light, generating a higher harmonic signal, performing ground state depletion and performing microscopic imaging. With the implementation of the present invention, the stimulated electrons of the organic material remains majorly on the singlet (S1) state or the triplet (T1) state, instead of the ground (S0) state, to provide modulation of the spatial distribution of the non-fluorescence signal, and make STED microscopy applicable to non-fluorescence signals to promote the resolution of the images.

Abstract translation: 本发明公开了一种非荧光高次谐波生成基态耗尽超分辨率显微镜的方法，包括以下步骤：提供有机材料单元，聚焦激发光和基态耗尽光，产生高次谐波信号，进行地面 状态耗尽和执行显微成像。 通过本发明的实现，有机材料的受激电子主要保持在单线态（S1）状态或三线态（T1）状态，而不是地（S0）状态，以提供对 非荧光信号，并使STED显微镜适用于非荧光信号，以促进图像的分辨率。

公开(公告)号：US20160320305A1

公开(公告)日：2016-11-03

申请号：US14741629

申请日：2015-06-17

Applicant: National Central University

Inventor： Szu-Yu CHEN ,  Poyu SU ,  Chiao-Sheng LU ,  Yu John HSU

IPC: G01N21/64 ,  G01J3/28 ,  G01J3/12 ,  G01J3/02 ,  G01J3/10

CPC classification number: G01N21/6458 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0267 ,  G01J3/04 ,  G01J3/06 ,  G01J3/10 ,  G01J3/12 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/4406 ,  G01J2003/2813 ,  G01J2003/282 ,  G01N2021/6421 ,  G01N2021/6423 ,  G01N2021/6476 ,  G01N2021/6478

Abstract: A fluorescence hyperspectral microscopy system featuring structured illumination and parallel recording includes a light projection sub-system, a detection sub-system, and an electrical controller. The light projection sub-system includes a digital light processing (DLP) module for generating linear excitation light, a first lens set, an optical path allocation element, and an objective lens. The detection sub-system includes a second lens set, a frequency-dividing reflection element, a two-dimensional light detector, and a light collection element. With the detection sub-system performing detection in conjunction with the light projection sub-system, and the electrical controller controlling the DLP module, a two-dimensional moving platform, and the two-dimensional light detector, the fluorescence hyperspectral microscopy system provides increased resolution and can obtain accurate information in spatial and spectral dimensions and hence a four-dimensional hyperspectral image of the object under detection.

Abstract translation: 具有结构照明和并行记录的荧光高光谱显微系统包括光投影子系统，检测子系统和电控制器。 光投影子系统包括用于产生线性激发光的数字光处理（DLP）模块，第一透镜组，光路分配元件和物镜。 检测子系统包括第二透镜组，分频反射元件，二维光检测器和光收集元件。 通过检测子系统与光投影子系统进行检测，控制DLP模块的电气控制器，二维移动平台和二维光检测器，荧光高光谱显微系统提供更高的分辨率 并且可以在空间和光谱维度上获得准确的信息，并因此获得被检测物体的四维高光谱图像。

公开(公告)号：US20140049631A1

公开(公告)日：2014-02-20

申请号：US13652206

申请日：2012-10-15

Applicant: NATIONAL CENTRAL UNIVERSITY

Inventor： Ching-Cherng SUN ,  Yeh-Wei YU ,  Che-Chu LIN ,  Szu-Yu CHEN

IPC: G02B21/00 ,  H04N7/18

CPC classification number: G01N21/45 ,  A61B5/0059 ,  G02B21/0056 ,  G02B21/082 ,  G02B21/14 ,  G02B21/16 ,  G02B21/365

Abstract: The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.

Abstract translation: 本发明公开了一种具有相位共轭反射镜的显微镜成像结构及其方法。 上述成像结构与原始探针光束一起产生反向聚焦共轭探针光束。 这两个探测光束在被探测物体的焦点处相交，产生干涉图案。 干涉图案中的任何两个相邻波前的间隔是原始探测波长波长的一半，因此改善了图像的垂直分辨率。 本发明还将光调制器模块应用在探测光束上，以容易地将探测光束的焦点和相位共轭反向聚焦探测光束的深度调节到物体中。 采用本发明，消除了目标物体的尺寸或位置限制，并且还提高了成像分辨率。