公开(公告)号：US20190041433A1

公开(公告)日：2019-02-07

申请号：US16004166

申请日：2018-06-08

Applicant: NUVOTON TECHNOLOGY CORPORATION

Inventor： Te-Ming TSENG ,  Yeh-Tai HUNG ,  Wen-Yi LI

IPC: G01R19/10 ,  H03K5/24

CPC classification number: G01R19/10 ,  G01R19/16552 ,  G05F1/625 ,  H03K5/24

Abstract: Provided is a system for testing a reference voltage circuit applicable to a reference voltage circuit. The reference voltage circuit includes a bandgap reference voltage circuit, switching elements, a first capacitor, a second capacitor and a comparator. The testing system includes a control logic unit. In a test mode, the control logic unit adjusts an allowable value of the comparator to speed up the suitability test of the switching elements.

公开(公告)号：US20190072588A1

公开(公告)日：2019-03-07

申请号：US15860945

申请日：2018-01-03

Applicant: NUVOTON TECHNOLOGY CORPORATION

Inventor： Po-Sheng CHEN ,  Te-Ming TSENG ,  Yeh-Tai HUNG

IPC: G01R19/165 ,  H03K17/22 ,  H03K21/38 ,  G01R19/155

CPC classification number: G01R19/16519 ,  G01R19/155 ,  H03K17/223 ,  H03K21/38

Abstract: The present disclosure illustrates a low-power voltage detection circuit, including a threshold voltage detection circuit, a leakage detection circuit and a low-voltage detection circuit. By utilizing the above-mentioned threshold voltage detection circuit and leakage detection circuit, the voltage variations caused by leakage, temperature or process can be detected in the more efficient and power saving way.