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公开(公告)号:US11289621B2
公开(公告)日:2022-03-29
申请号:US16768029
申请日:2018-11-26
IPC分类号: H01L21/00 , H01L33/00 , B23K26/0622 , B23K26/359 , B23K26/00 , B23K103/00
摘要: A method includes preparing a wafer including a substrate and a semiconductor structure, and irradiating an inner portion of the substrate at a predetermined depth in a thickness direction a plurality of times with laser pulses at a first time interval and a predetermined distance interval between irradiations. Each irradiation performed at the first time intervals in the step of irradiating the substrate with laser pulses includes irradiating the substrate at a first focal position in the thickness direction with a first laser pulse having a first pulse-energy; and after irradiating with the first laser pulse, irradiating the substrate with a second laser pulse performed after a second time interval, the second time interval being shorter than the first time interval and being in a range of 3 ps to 900 ps, and the second laser pulse having a second pulse-energy 0.5 to 1.5 times the first pulse-energy.
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公开(公告)号:US11945173B2
公开(公告)日:2024-04-02
申请号:US17847928
申请日:2022-06-23
CPC分类号: B29C65/1609 , B29C66/91221 , B29C66/952
摘要: A method for processing a resin member includes: irradiating a first member comprising a resin with first light of a first wavelength that causes electronic excitation of the resin; and irradiating the resin electronically excited through irradiation with the first light with second light of a second wavelength longer than the first wavelength. A wavelength range of the second wavelength is within a wavelength range in which light absorption of the resin increases through electronic excitation of the resin.
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公开(公告)号:US10672660B2
公开(公告)日:2020-06-02
申请号:US15902756
申请日:2018-02-22
申请人: NICHIA CORPORATION
发明人: Naoto Inoue , Sho Kusaka , Minoru Yamamoto , Masayuki Ibaraki , Hiroaki Tamemoto
IPC分类号: H01L21/78 , B23K26/57 , H01L33/00 , B23K26/53 , B23K103/00
摘要: A method of manufacturing a semiconductor element includes: providing a wafer having a semiconductor layered body on a sapphire substrate; irradiating a laser light in an interior region of the sapphire substrate to create cracks in the sapphire substrate by performing a first scan to irradiate the laser light at a first depth with a first pulse energy to create a first modified region, and a second scan following the first scan to irradiate the laser light at a second depth with a second pulse energy greater than the first pulse energy along and within the first modified region; and dividing the wafer by extending the cracks to obtain a semiconductor element.
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公开(公告)号:US11769852B2
公开(公告)日:2023-09-26
申请号:US16945729
申请日:2020-07-31
申请人: NICHIA CORPORATION
IPC分类号: H01L21/00 , H01L33/00 , H01L25/075 , H01L33/20
CPC分类号: H01L33/0095 , H01L25/0753 , H01L33/20
摘要: A method of manufacturing a light emitting element according to certain embodiments of the present disclosure includes: scanning and irradiating a first laser light having a first irradiation intensity to a sapphire substrate along predetermined dividing lines collectively in a shape of a tessellation of a plurality of hexagonal shapes in a top view to create a plurality of first modified regions along the predetermined dividing lines; and scanning and irradiating a second laser light having a second irradiation intensity greater than the first irradiation intensity to the sapphire substrate along the predetermined dividing lines to create a plurality of second modified regions overlapping the plurality of first modified regions.
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公开(公告)号:US11489086B2
公开(公告)日:2022-11-01
申请号:US16908354
申请日:2020-06-22
申请人: NICHIA CORPORATION
IPC分类号: H01L33/00
摘要: A method of manufacturing light emitting elements includes: providing a wafer including a substrate formed of sapphire and having a first main surface and a second main surface, and a semiconductor layered body disposed on the first main surface of the substrate; irradiating a laser beam into the substrate to form a modified region inside the substrate, the modified region having a crack reaching the first main surface and a crack reaching the second main surface; irradiating CO2 laser to a region of the substrate overlapping with a region to which the laser beam has been irradiated; and cleaving the wafer along the modified region to obtain the light emitting elements each having a hexagonal shape in a plan view.
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