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公开(公告)号：US11435705B2
公开(公告)日：2022-09-06
申请号：US16307531
申请日：2016-06-10
申请人： NEC Corporation
发明人： Wemer Wee , Yoshio Kameda , Riki Eto
摘要： An expert model unit 81 generates predicted expert control actions based on an expert model which is a machine learning model trained using data collected when an expert operated a plant which is a control target or a plant of the same or similar characteristics. A transformer 82 constructs metrics or error measures involving the predicted expert control actions from the expert model unit 81 as an objective term. A combiner 83 collects different objective terms from the transformer 82 and a learner which outputs machine-learning models as objective terms and computes an optimal set of weights or combinations of the objective terms to construct an aggregated cost function for use in an optimizer.
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公开(公告)号：US11443219B2
公开(公告)日：2022-09-13
申请号：US16481715
申请日：2018-01-18
申请人： NEC CORPORATION
发明人： Riki Eto , Yoshio Kameda
摘要： A model estimation system estimates a model of a system represented by an ordinary differential equation with all coefficients being non-zero, and with which input data and a state at each time can be obtained. When an order of the ordinary differential equation and input data and a state at multiple past times in the system are inputted, a model expression construction unit constructs an expression representing a model by using a first matrix that is a matrix according to the order and has only some elements as unknown elements and a second matrix that is a matrix according to the order and has only some one element as an unknown element. A model estimation unit uses input data and a state at multiple past times, to estimate the model by learning unknown elements of the first matrix and the unknown element of the second matrix.
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公开(公告)号：US10048658B2
公开(公告)日：2018-08-14
申请号：US14914761
申请日：2014-05-08
申请人： NEC Corporation
发明人： Yoshio Kameda , Takeo Nozaki , Satoshi Morinaga , Manabu Kusumoto
摘要： An information processing device according to the present invention, includes: an information accumulation unit which receives and accumulates control-target information that includes information related to a control target and an environment including the control target; a prediction-equation-set learning and generation unit which learns and generates a prediction-equation set to be used for determination of an operation quantity of the control target based on the control-target information accumulated in the information accumulation unit; and an operation-quantity determination unit which receives input information needed for determination of an operation quantity of the control target, constructs a predictive-control model of the control target based on the prediction-equation set, the control-target information accumulated in the information accumulation unit, the control-target information received, and the input information, and determines an operation quantity used for control of the control target.
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4.发明授权公开(公告)号：US11579574B2
公开(公告)日：2023-02-14
申请号：US16349315
申请日：2017-02-10
申请人： NEC Corporation
发明人： Wemer Wee , Yoshio Kameda
摘要： A control customization system 80 customizes a plant control. A profiler 81 predicts actions of a user depending on situations of the plant or the user. A planner 82 determines an appropriate set of objectives which represent tasks desired by the user, and objective terms representing elements for controlling the plant so as to realize the objectives, and tunes the objective terms based on predictions of the profiler 81.
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5.发明授权公开(公告)号：US10776945B2
公开(公告)日：2020-09-15
申请号：US15742982
申请日：2016-07-19
申请人： NEC Corporation
发明人： Kenichiro Fukushi , Manabu Kusumoto , Yoshio Kameda , Hisashi Ishida , Chenpin Hsu , Takeo Nozaki
摘要： Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface. A dimension measurement device according to the present invention is provided with: a reference scale extraction means for extracting, from photographed image data including a reference scale that includes a film that has a pattern for displaying a length reference formed on the surface thereof and a lens that is in contact with the film, an image in which an image of the length reference is formed on the basis of the relationship between a pattern function expressing the length reference projected onto the lens according to variation in a prescribed angle between the reference scale and the optical axis of a photography device and an image formation color function indicating the image of the length reference formed on the imaging device; an object of measurement extraction means for extracting an object of measurement image from photographed image data including the reference scale; and a dimension calculation means for calculating a dimension of the object of measurement on the basis of a dimension of the image in which the image of the length reference is formed and the image of the object of measurement.
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