Abstract:
A multilayer ceramic capacitor contains Ni in internal electrodes, and includes a sintered metal layer containing Cu in external electrodes. At a joined portion between each internal electrode and each external electrode, mutual diffusion layers of Cu and Ni extend across the internal and external electrodes. On each internal electrode, a mutual diffusion layer is present with a thickness t1, which is defined by a dimension from a first end surface or a second end surface to an interior end in a longitudinal direction, not smaller than about 0.5 μm and not greater than about 5 μm. On each external electrode, a mutual diffusion layer is present with a thickness t2, which is defined by a dimension from the first end surface or the second end surface to an exterior end in the longitudinal direction, not smaller than about 2.5% and not greater than about 33.3% of a thickness t0 of a sintered metal layer.
Abstract:
A multilayer electronic component includes a multilayer body including dielectric layers and inner electrode layers, the multilayer body including an electrode facing portion in which the inner electrode layers are laminated to face each other with the dielectric layers interposed therebetween. The multilayer body has a thickness of at least about 1.5 mm in a lamination direction, a length of at least about 3.0 mm, and a width of at least about 1.5 mm. Each of the dielectric layers includes Ba, Ti, and Cl. A Cl concentration C1 in the entire electrode facing portion satisfies about 10 wtppm≤C1≤about 50 wtppm. On an imaginary central axis line, a Cl concentration C2 in a central portion of the electrode facing portion and a Cl concentration C3 in both end portions of the electrode facing portion satisfy about 0.5C2≤C3
Abstract:
In a multilayer ceramic capacitor, an inner ceramic layer includes a perovskite-type compound containing Ba and Ti. A region within an electrically effective portion of the inner ceramic layers sandwiched between inner electrodes, which is near an area where inner and outer electrodes connect to each other, is subjected to a mapping analysis using EDS. ((L2−L3)/L1)×100≧50 is satisfied, L1 denotes a total length of ceramic grain boundaries detected from a TEM transmission image, L2 denotes a total length of grain boundaries, detected from a mapping image and the TEM transmission image, where the rare earth element is present, and L3 denotes a total length of portions, detected from a mapping image and the TEM transmission image, in which the grain boundaries where the rare earth element is present and grain boundaries where at least one of Mn, Mg, and Si is present are overlapped.
Abstract:
In a monolithic ceramic capacitor, ceramic layers defining inner layers are mainly composed of a perovskite compound containing Ba and Ti. A portion of an electrically effective section in the ceramic layers near a connecting portion between the inner electrodes and an outer electrode undergoes mapping analysis by an energy-dispersive method. In regions of the resulting mapping image, the regions extending from the interfaces between the inner electrodes and a corresponding one of the ceramic layers to positions about ⅓ of the thickness of the ceramic layer in the stacking direction, ((L2−L3)/L1)×100≧50 is satisfied, where L1 represents the total length of grain boundaries, L2 represents the total length of grain boundaries where a rare-earth element is present, and L3 represents the total length of portions where the grain boundaries where the rare-earth element is present are overlapped with grain boundaries with a specific element present.