Abstract:
A semiconductor device is provided. Gates of first PMOS and NMOS transistors are coupled together for receiving an input signal. Gates of second PMOS and NMOS transistors are coupled together. Gates of third PMOS and NMOS transistors are coupled together. Gates of fourth PMOS and NMOS transistors are coupled together. Drains of fourth PMOS and NMOS transistors are coupled together for providing an output signal. When the first, second, third and fourth NMOS transistors are connected in parallel and the first, second, third and fourth PMOS transistors are connected in parallel, the output signal is provided according to the input signal and a first logic function. When the first and second NMOS transistors are connected in serial and the first and second PMOS transistors are connected in serial, the output signal is provided according to the input signal and a second logic function.
Abstract:
A clock buffer circuit is provided. The clock buffer circuit receives an input clock signal and generates a delay clock signal. The clock buffer circuit includes an input circuit, an output circuit, a first delay path, and a second delay path. The input circuit receives the input clock signal and generates an output clock signal according to the input clock signal. The output circuit generates the delay clock signal. The first delay path is coupled between the input circuit and the output circuit. The second delay path is coupled between the input circuit and the output circuit. The input circuit selectively provides the output clock signal to a first specific delay path among the first and second delay paths according to a control signal. The output circuit receives the output clock signal which passes through the first specific delay path and outputs the delay clock signal.
Abstract:
A scan chain circuit is provided. The scan chain circuit includes first and second scan flip-flops and a clock generator. Each of the first and second scan flip-flops has a data-in terminal, a scan-in terminal, a clock terminal, and a data-out terminal. The clock terminals of the first and second scan flip-flop receive first and second clock signals respectively. The data-in terminal of the second scan flip-flop is coupled to the data-out terminal of the first scan flip-flop. During a scan shift cycle of the test mode, an enable pulse of a second clock-enable signal is delayed from an enable pulse of a first clock-enable signal, and the clock generator generates the first clock signal according to the scan clock signal and the first clock-enable signal and further generates the second clock signal according to the scan clock signal and the second clock-enable signal.