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公开(公告)号：US20240029258A1
公开(公告)日：2024-01-25
申请号：US18270886
申请日：2022-02-08
Applicant: LUNIT INC.
Inventor： Minchul KIM , Gunhee NAM , Thijs KOOI
CPC classification number: G06T7/0016 , G06T7/62 , G06T2207/10116 , G06T2207/30096 , G06T2207/20081 , G06T2207/30061 , G06T2207/20084
Abstract: A method for measuring a size change of a target lesion in an X-ray image is provided, including receiving a first X-ray image including the target lesion and a second X-ray image including the target lesion, calculating an occupancy of a region corresponding to the target lesion in criterion regions in each of the first X-ray image and the second X-ray image, and measuring a size change of the target lesion based on the calculated occupancies.
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公开(公告)号：US20220199258A1
公开(公告)日：2022-06-23
申请号：US17689196
申请日：2022-03-08
Applicant: Lunit Inc.
Inventor： Donggeun YOO , Seungwook PAEK , Minchul KIM , Jongchan PARK
Abstract: A training method for specializing an artificial intelligence model in an institution for deployment and an apparatus for performing training the artificial intelligence model are provided. A method for operating a training apparatus operated by at least one processor includes extracting a dataset to be used for specialized training from data retained by a certain institution, selecting an annotation target for which annotation is required from the dataset by using a pre-trained artificial intelligence (AI) model, and performing supervised training of the pre-trained AI model by using data annotated with a label for the annotation target.
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公开(公告)号：US20230200740A1
公开(公告)日：2023-06-29
申请号：US18177266
申请日：2023-03-02
Applicant: LUNIT INC.
Inventor： Donggeun YOO , Sanghyup LEE , Minchul KIM , Hanjun LEE , Sunggyun PARK
CPC classification number: A61B5/7264 , A61B6/5217 , G06T7/0012
Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.
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公开(公告)号：US20230053280A1
公开(公告)日：2023-02-16
申请号：US17973672
申请日：2022-10-26
Applicant: LUNIT INC.
Inventor： Donggeun YOO , Sanghyup LEE , Minchul KIM , Hanjun LEE , Sunggyun PARK
Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.
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