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公开(公告)号：US20230200740A1
公开(公告)日：2023-06-29
申请号：US18177266
申请日：2023-03-02
Applicant: LUNIT INC.
Inventor： Donggeun YOO , Sanghyup LEE , Minchul KIM , Hanjun LEE , Sunggyun PARK
CPC classification number: A61B5/7264 , A61B6/5217 , G06T7/0012
Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.
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公开(公告)号：US20230053280A1
公开(公告)日：2023-02-16
申请号：US17973672
申请日：2022-10-26
Applicant: LUNIT INC.
Inventor： Donggeun YOO , Sanghyup LEE , Minchul KIM , Hanjun LEE , Sunggyun PARK
Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.
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